Single event upset (SEU) has become one of the major threats to dependable application
development targeted at safety systems in field programmable gate arrays (FPGAs). This …

Detection of objects of a given class is important for many applications. However it is difficult
to learn a general detector with high detection rate as well as low false alarm rate …

Systems working in uncertain environments should possess a robustness property, which
ensures that the behaviours of the system remain close to the original behaviours under the …

The programmable logic block (PLB) in a modern FPGA features a built-in carry chain (or
adder) and a decomposable LUT, where such an LUT may be decomposed into two or more …

As device size shrinks to the nanometer range, FPGAs are increasingly prone to
manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very …

As the feature size shrinks to the nanometer scale, SRAM-based FPGAs will become
increasingly vulnerable to soft errors. Existing reliability-oriented placement and routing …

We present a fault-tolerant post-map** resynthesis for FPGA-based designs that exploits
the dual-output feature of modern FPGA architectures to improve the reliability of a mapped …

Reliability has become an increasingly important concern for SRAM-based field
programmable gate arrays (FPGAs). Targeting SEU (single event upset) in SRAM-based …

With the wide application of SRAM-base FPGA in aerospace engineering, the radiation
resistance performance of FPGAs becomes unprecedented important. To correct errors, the …

A key property for systems subject to uncertainty in their operating environment is
robustness: ensuring that unmodeled but bounded disturbances have only a proportionally …