Fundamentals of silicon material properties for successful exploitation of strain engineering in modern CMOS manufacturing
PR Chidambaram, C Bowen… - … on Electron Devices, 2006 - ieeexplore.ieee.org
Semiconductor industry has increasingly resorted to strain as a means of realizing the
required node-to-node transistor performance improvements. Straining silicon …
required node-to-node transistor performance improvements. Straining silicon …
Continuous MOSFET performance increase with device scaling: The role of strain and channel material innovations
DA Antoniadis, I Aberg, CN Chleirigh… - IBM Journal of …, 2006 - ieeexplore.ieee.org
A simple model that links MOSFET performance, in the form of intrinsic switch delay, to
effective carrier velocity in the channel is developed and fitted to historical data. It is shown …
effective carrier velocity in the channel is developed and fitted to historical data. It is shown …
Physical and technological limitations of NanoCMOS devicesto the end of the roadmap and beyond
S Deleonibus - The European Physical Journal-Applied Physics, 2006 - cambridge.org
Since the end of the last millenium, the microelectronics industry has been facing new
issues as far as CMOS devices scaling is concerned. Linear scaling will be possible in the …
issues as far as CMOS devices scaling is concerned. Linear scaling will be possible in the …
Ultrathin-body strained-Si and SiGe heterostructure-on-insulator MOSFETs
I Aberg, CN Chleirigh, JL Hoyt - IEEE transactions on electron …, 2006 - ieeexplore.ieee.org
The combination of channel mobility-enhancement techniques such as strain engineering
with nonclassical MOS device architectures, such as ultrathin-body (UTB) or double-gate …
with nonclassical MOS device architectures, such as ultrathin-body (UTB) or double-gate …
A unified interdiffusivity model and model verification for tensile and relaxed SiGe interdiffusion over the full germanium content range
An interdiffusivity model was established for SiGe interdiffusion under tensile or relaxed
strain over the full Ge content (x Ge) range (0≤ x Ge≤ 1), which is based on the correlations …
strain over the full Ge content (x Ge) range (0≤ x Ge≤ 1), which is based on the correlations …
Interdiffusion in group IV semiconductor material systems: applications, research methods and discoveries
GM **a - Science Bulletin, 2019 - Elsevier
Group IV semiconductor alloys and heterostructures such as SiGe, GeSn, Ge/Si and SiGe: C
have been widely used and under extensive research for applications in major …
have been widely used and under extensive research for applications in major …
Processing aspects in the low-frequency noise of nMOSFETs on strained-silicon substrates
E Simoen, G Eneman, P Verheyen… - IEEE transactions on …, 2006 - ieeexplore.ieee.org
The impact of different processing factors on the low-frequency (LF) noise of nMOSFETs
fabricated in strained-silicon (SSi) substrates will be described. It is shown that the use of an …
fabricated in strained-silicon (SSi) substrates will be described. It is shown that the use of an …
Rapid thermal processing
PJ Timans, R Sharangpani, RPS Thakur… - … Technology, Y. Nishi …, 2000 - books.google.com
Rapid thermal processing (RTP) is a key technology in the fabrication of advanced
integrated circuits, with a wide range of applications, including titanium silicide and nitride …
integrated circuits, with a wide range of applications, including titanium silicide and nitride …
Rapid thermal processing for silicon nanoelectronics applications
AT Fiory - JOM, 2005 - Springer
Single-wafer rapid thermal processing, which has become indispensable in the present-day
manufacture of integrated circuits, has replaced batch furnace processing to satisfy device …
manufacture of integrated circuits, has replaced batch furnace processing to satisfy device …
Theoretical study of B diffusion with charged defects in strained Si
L Lin, T Kirichenko, BR Sahu, GS Hwang… - Physical Review B …, 2005 - APS
We investigate B diffusion in strained Si by using density functional theory calculations. We
calculate the migration barriers and formation energies of the B-Si complexes at different …
calculate the migration barriers and formation energies of the B-Si complexes at different …