Processor core profiling for SEU effect analysis
This paper presents the analysis of a fault injection campaign in the CPU registers of the
LEON3 softcore processor. The faults are injected through the use of simulation scripts that …
LEON3 softcore processor. The faults are injected through the use of simulation scripts that …
[PDF][PDF] Methods to Optimize Functional Safety Assessment for Automotive Integrated Circuits
AÇ Bağbaba - 2022 - scholar.archive.org
This PhD thesis addresses functional safety assessment methods targeting automotive
Integrated Circuits (IC), emphasizing optimization techniques. This introductory chapter …
Integrated Circuits (IC), emphasizing optimization techniques. This introductory chapter …
Accelerating transient fault injection campaigns by using dynamic hdl slicing
Along with the complexity of electronic systems for safety-critical applications, the cost of
safety mechanisms evaluation by fault injection simulation is rapidly going up. To reduce …
safety mechanisms evaluation by fault injection simulation is rapidly going up. To reduce …
Fault Resilient Micro-Coded Control Unit for Space-Based Digital Systems
The deployment of SoC-based FPGAs is gaining popularity for space applications due to
their adaptability and reconfigurability. However, transient faults such as Single Event …
their adaptability and reconfigurability. However, transient faults such as Single Event …
Design of Watchdog Circuit using Decision Trees for Detection of Single Event Upsets in Processor
B Varaprasad, R Anilkumar, BA Prasad… - 2021 Third …, 2021 - ieeexplore.ieee.org
Digital circuits operating in space are susceptible to Single Event Upsets (SEU) caused by
radiation. The single event upset (SEU) susceptibility is more pronounced in newer …
radiation. The single event upset (SEU) susceptibility is more pronounced in newer …
Evaluating hardware reliability in the presence of soft errors
B Xue - 2024 - eprints.soton.ac.uk
Reliability has been a major concern in embedded systems. Higher transistor density and
lower voltage supply increase the vulnerability of embedded systems to soft errors. A Single …
lower voltage supply increase the vulnerability of embedded systems to soft errors. A Single …