Logic built-in self-test (LBIST) is now increasingly used with on-chip test compression as a
complementary solution for in-system test, where high quality, low power, low silicon area …

High integration densities and design complexity of printed-circuit boards make board-level
functional fault identification extremely difficult. Machine learning provides an opportunity to …

Under the functional safety standard ISO26262, automotive systems require testing in the
field, such as the power-on self-test (POST). Unlike the production test, the POST requires …

High integration densities and design complexity make board-level functional fault diagnosis
extremely difficult. Machine-learning techniques can identify functional faults with high …

As cars become increasingly computerized and their safety functions are evolving rapidly,
the number of complex safety-critical components deployed in advanced driver assistance …

The occurrence of silent data corruption because of hardware defects in large scale data
centers points to the advantages of applying functional test sequences to detect hardware …

As cars become increasingly computerized and their safety functions evolve rapidly, the
number of complex safety-critical components deployed in advanced driver assistance …

While power reduction during testing is necessary for today's low-power devices, it also
lowers test costs. Scan-based methods are the most widely used approach for testing …

This paper presents a new staggered test pattern generation scheme. It produces
deterministic stimuli in the course of a test-per-clock-based process by using dedicated …

This paper presents a novel low-area scan-based logic built-in self-test (LBIST) scheme that
addresses stringent test requirements of certain application domains such as the fast …