Atomic force microscopy (AFM), as a type of scanning probe microscopy (SPM), possesses
formidable capabilities for nanoscale imaging and force spectroscopy. Due to its advantages …

In Conduction Atomic Force Microscopy (CAFM), it is sometimes required to monitor
electrical data at a single location over an extended period of time. However, thermal drift of …

Local currents measured under standard conductive atomic force microscopy (C‐AFM)
conditions on microcrystalline silicon (µc‐Si: H) thin films were studied. It was shown that the …

A link between the morphological characteristics and the electric properties of amorphous
layers is established by means of atomic, conductive, electrostatic force and thermal …

Multicrystalline silicon (mc-Si) is a widely used material for photovoltaic applications. The
presence of metallic contaminated grain boundaries strongly affects the crystal electronic …

The nanostructure of carbon nanowalls (CNWs) was investigated by Torsion Resonance
(TR) Atomic Force Microscopy (AFM). In this dynamic non-contact imaging mode a cantilever …

Hydrogenated nanocrystalline silicon (nc-Si: H) is a multiphase, heterogeneous material,
composed of Si nanocrystals embedded in an amorphous matrix. It has been intensively …

We show that local currents observed by the conductive atomic force microscopy (C-AFM) of
silicon thin films measured in ambient atmosphere are generally limited by surface oxide …

We report on direct imaging of current collection by performing conductive atomic force
microscopy (C-AFM) measurement on a complete Cu (In, Ga) Se 2 solar cell. The localized …

SiO x N y is an innovative material that has recently attracted a lot of attention in different and
new applications, ranging from photovoltaics, conductive oxide, carbon capture; …