This work discusses studies of electron emissions during the interaction of low energy (in the
keV energy range and below) singly charged ions with Aluminum surfaces. Analysis of the …

The inelastic energy deposition of energetic ions is a decisive quantity for numerous
industrial-scale applications, such as sputtering and ion implantation, yet the underlying …

We investigate the electronic excitation of silicon by hydrogen, helium, nitrogen, and neon
ions for ion energies ranging from several tens to a few hundred kiloelectronvolts …

We measured spectra of low energy electrons emitted in the interaction of singly charged
Ne+ ions with the Mg surface at incident ion energies ranging from 50 eV to 4 keV. The study …

Scanning transmission ion microscopy imaging was performed whilst using a delay-line
detector to record the impact position and arrival time of transmitted ions or neutrals. The …

We address the long standing issue of the dominant excitation of the triplet 2p 4 (3 P) 3s 2
state in the scattering of Neon projectiles from Magnesium, Aluminum and Silicon surfaces …

A 16 MHz electrostatic beam chopper is implemented at the Uppsala University ToF-MEIS
system to complement the 4 MHz sinusoidal scanning, refining the resolution without drift …

By performing time-dependent density functional theory simulations, we reveal an
anomalous deviation from linear low-velocity electronic stop** for slow channeling helium …

We report energy distributions of electrons emitted by Aluminum and Magnesium surfaces
under the impact of singly charged neon ions with energies in the range 100–5000 eV …

We report angle-resolved energy spectra of electron emitted in the interaction of slow singly
charged heavy ions with Mg surface. The work is focused mainly on the excitation of …