One-class classification: taxonomy of study and review of techniques

SS Khan, MG Madden - The Knowledge Engineering Review, 2014 - cambridge.org
One-class classification (OCC) algorithms aim to build classification models when the
negative class is either absent, poorly sampled or not well defined. This unique situation …

LS-SVM based spectral clustering and regression for predicting maintenance of industrial machines

R Langone, C Alzate, B De Ketelaere… - … Applications of Artificial …, 2015 - Elsevier
Accurate prediction of forthcoming faults in modern industrial machines plays a key role in
reducing production arrest, increasing the safety of plant operations, and optimizing …

[PDF][PDF] Automatic control and machine learning for semiconductor manufacturing: Review and challenges

GA Susto, S Pampuri, A Schirru… - Proceedings of the …, 2012 - eprints.nuim.ie
Semiconductor manufacturing is one of the most technologically advanced industrial
sectors. Process quality and control are critical for decreasing costs and increasing yield …

Using semi-supervised classifiers for credit scoring

K Kennedy, BM Namee, SJ Delany - Journal of the Operational …, 2013 - Taylor & Francis
In credit scoring, low-default portfolios (LDPs) are those for which very little default history
exists. This makes it problematic for financial institutions to estimate a reliable probability of …

Estimation and control in semiconductor etch: Practice and possibilities

JV Ringwood, S Lynn, G Bacelli, B Ma… - IEEE Transactions …, 2009 - ieeexplore.ieee.org
Semiconductor wafer etching is, to a large extent, an open-loop process with little direct
feedback control. Most silicon chip manufacturers rely on the rigorous adherence to a …

Steady-state process fault detection for liquid rocket engines based on convolutional auto-encoder and one-class support vector machine

X Zhu, Y Cheng, J Wu, R Hu, X Cui - Ieee Access, 2019 - ieeexplore.ieee.org
Liquid rocket engines (LREs) are the main propulsive devices of launch vehicles. Due to the
complex structures and extreme working environments, LREs are also the components …

Credit scoring using machine learning

K Kennedy - 2013 - arrow.tudublin.ie
For financial institutions and the economy at large, the role of credit scoring in lending
decisions cannot be overemphasised. An accurate and well-performing credit scorecard …

Physics-prior Bayesian neural networks in semiconductor processing

CH Chen, P Parashar, C Akbar, SM Fu, MY Syu… - IEEE …, 2019 - ieeexplore.ieee.org
With the fast scaling-down and evolution of integrated circuit (IC) manufacturing technology,
the fabrication process becomes highly complex, and the experimental cost of the processes …

A hybrid novelty score and its use in keystroke dynamics-based user authentication

P Kang, S Cho - Pattern recognition, 2009 - Elsevier
The purpose of novelty detection is to detect (novel) patterns that are not generated by the
identical distribution of the normal class. A distance-based novelty detector classifies a new …

Virtual metrology for plasma etch processes.

S Lynn - 2011 - mural.maynoothuniversity.ie
Plasma processes can present dicult control challenges due to time-varying dynamics and a
lack of relevant and/or regular measurements. Virtual metrology (VM) is the use of …