Computational study of edge configuration and quantum confinement effects on graphene nanoribbon transport

R Sako, H Hosokawa, H Tsuchiya - IEEE electron device letters, 2010 - ieeexplore.ieee.org
We investigated edge configuration and quantum confinement effects on electron transport
in armchair-edged graphene nanoribbons (A-GNRs) by using a computational approach …

Computational Study on the Performance of Si Nanowire pMOSFETs Based on the Method

M Shin, S Lee, G Klimeck - IEEE transactions on electron …, 2010 - ieeexplore.ieee.org
Full-quantum device simulations on p-type Si nanowire field-effect transistors based on the
k· p method, using the k· p parameters tuned against the sp 3 s* tight-binding method, are …

Simulation Study of Thin-Body Ballistic n-MOSFETs Involving Transport in Mixed -L Valleys

SR Mehrotra, M Povolotskyi, DC Elias… - IEEE electron device …, 2013 - ieeexplore.ieee.org
Transistor designs based on using mixed Γ-L valleys for electron transport are proposed to
overcome the density of states bottleneck while maintaining high injection velocities. Using a …

Comparisons of performance potentials of silicon nanowire and graphene nanoribbon MOSFETs considering first-principles bandstructure effects

H Tsuchiya, H Ando, S Sawamoto… - … on Electron Devices, 2010 - ieeexplore.ieee.org
In this paper, we investigate the performance potentials of silicon nanowire (SNW) and
semiconducting graphene nanoribbon (GNR) MOSFETs by using first-principles …

Impact of contact configuration on contact resistance in ultranarrow graphene nanoribbon devices

M Poljak, M Matić, A Zeljko - IEEE transactions on electron …, 2022 - ieeexplore.ieee.org
Contact resistance strongly deteriorates the performance of devices based on 2-D materials
and their nanostructures, masking their exceptional electronic and transport properties. This …

Modulation of ballistic injection velocity in phosphorene nanodevices by bias and confinement effects

M Matić, M Poljak - Solid-state electronics, 2023 - Elsevier
Atomistic quantum transport simulations are employed to study the electron injection velocity
(v inj) and ballistic performance of phosphorene nanoribbon (PNR) field-effect transistors …

Performance prediction of ultrascaled SiGe/Si core/shell electron and hole nanowire MOSFETs

A Paul, S Mehrotra, M Luisier… - IEEE electron device …, 2010 - ieeexplore.ieee.org
The performances of ultrascaled SiGe nanowire field-effect transistors (NWFETs) are
investigated using an atomistic tight-binding model and a virtual crystal approximation to …

On the bandstructure velocity and ballistic current of ultra-narrow silicon nanowire transistors as a function of cross section size, orientation, and bias

N Neophytou, SG Kim, G Klimeck… - Journal of Applied Physics, 2010 - pubs.aip.org
A 20 band sp 3 d 5 s∗ spin-orbit-coupled, semiempirical, atomistic tight-binding model is
used with a semiclassical, ballistic field-effect-transistor model, to theoretically examine the …

Thermionic emission as a tool to study transport in undoped nFinFETs

GC Tettamanzi, A Paul, GP Lansbergen… - IEEE electron device …, 2009 - ieeexplore.ieee.org
Thermally activated subthreshold transport has been investigated in undoped triple-gate
MOSFETs. The evolution of the barrier height and of the active cross-sectional area of the …

Interface trap density metrology of state-of-the-art undoped Si n-FinFETs

GC Tettamanzi, A Paul, S Lee… - IEEE Electron …, 2011 - ieeexplore.ieee.org
The presence of interface states at the MOS interface is a well-known cause of device
degradation. This is particularly true for ultrascaled FinFET geometries where the presence …