A numerical study on comparing the active and passive cooling of AlGaN/GaN HEMTs

X Chen, FN Donmezer, S Kumar… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
In this paper, the power density capability of AlGaN/GaN high-electron mobility transistors
(HEMTs) made on Si, SiC, and diamond substrates were compared with devices on Si and …

Effects of self-heating on performance degradation in AlGaN/GaN-based devices

B Benbakhti, A Soltani, K Kalna… - IEEE transactions on …, 2009 - ieeexplore.ieee.org
A self-consistent electrothermal transport model that couples electrical and thermal transport
equations is established and applied to AlGaN/GaN device structures grown on the …

The effects of gate-connected field plates on hotspot temperatures of AlGaN/GaN HEMTs

C Dundar, D Kara, N Donmezer - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
To increase the reliability and the maximum performance of AlGaN/GaN high electron
mobility transistors (HEMTs), gate field plates are frequently used with surface passivation …

Characterization of the nonlinear thermal resistance and pulsed thermal dynamic behavior of AlGaN–GaN HEMTs on SiC

C Florian, A Santarelli, R Cignani… - IEEE transactions on …, 2013 - ieeexplore.ieee.org
A laboratory setup, along with a set of measurement and identification procedures, have
been developed expressly for the characterization of the thermal behavior of AlGaN/GaN …

Hybrid electrothermal simulations of GaN HEMT devices based on self-heating free virtual electrical characteristics

A Valletta, V Mussi, M Rapisarda… - … on Electron Devices, 2021 - ieeexplore.ieee.org
The electrothermal behavior of gallium nitride (GaN) HEMTs has been simulated by using a
hybrid approach in which the problem is solved by coupling together an effective model (for …

Scalable modeling of transient self-heating of GaN high-electron-mobility transistors based on experimental measurements

A Cutivet, G Pavlidis, B Hassan… - … on Electron Devices, 2019 - ieeexplore.ieee.org
This paper details an extraction procedure to fully model the transient self-heating of
transistors from a GaN HEMT technology. Frequency-resolved gate resistance thermometry …

GaN transistor characterization and modeling activities performed within the frame of the KorriGaN project

T Reveyrand, W Ciccognani, G Ghione… - International Journal of …, 2010 - cambridge.org
The present paper presents the transistor modeling work achieved in the GaN European
project KorriGaN (“Key Organisation for Research in Integrated Circuits in GaN technology”) …

Analysis of the thermal behavior of AlGaN/GaN HEMTs

S Russo, V d'Alessandro, M Costagliola… - Materials Science and …, 2012 - Elsevier
The thermal behavior of state-of-the-art multifinger AlGaN/GaN HEMTs grown on SiC is
thoroughly analyzed under steady-state and dynamic conditions. Accurate 3-D FEM …

Improvements from SiC substrate thinning in AlGaN/GaN HEMTs: disparate effects on contacts, access and channel regions

B Parvez, J Jha, P Upadhyay… - IEEE Electron …, 2021 - ieeexplore.ieee.org
We report the positive effects of SiC substrate thinning on the DC and RF performance of
AlGaN/GaN high electron mobility transistors (HEMTs). The substrate is thinned down from …

Estimation of channel temperature and thermal sensitivity for a 0.15 μm GaN HEMT

AZ Chowdhury, MA Alim, S Islam, C Gaquiere - Microelectronic …, 2021 - Elsevier
In this paper, we have investigated the channel temperature and thermal sensitivity for a
0.15 μm gate GaN HEMT at nine different temperatures from 233 K to 423 K. The estimation …