Resilience-driven system design of complex engineered systems

BD Youn, C Hu, P Wang - 2011 - asmedigitalcollection.asme.org
Most engineered systems are designed with a passive and fixed design capacity and,
therefore, may become unreliable in the presence of adverse events. Currently, most …

Monolithically integrated perovskite semiconductor lasers on silicon photonic chips by scalable top-down fabrication

PJ Cegielski, AL Giesecke, S Neutzner… - Nano …, 2018 - ACS Publications
Metal-halide perovskites are promising lasing materials for the realization of monolithically
integrated laser sources, the key components of silicon photonic integrated circuits (PICs) …

[HTML][HTML] Classification of (micro) plastics using cathodoluminescence and machine learning

EM Höppener, MS Shahmohammadi, LA Parker… - Talanta, 2023 - Elsevier
Microplastics are a growing environmental and toxicological concern, having been found in
the remotest locations of the earth and within multiple organs of the human body. However …

20W continuous wave reliable operation of 980nm broad-area single emitter diode lasers with an aperture of 96um

P Crump, G Blume, K Paschke… - High-Power Diode …, 2009 - spiedigitallibrary.org
High power broad area diode lasers provide the optical energy for all high performance
solid state and fiber laser systems. The maximum achievable power density from such …

Room temperature control of grain orientation via directionally modulated current pulses

MH Rahman, H Oh, D Waryoba… - Materials Research …, 2023 - iopscience.iop.org
Traditional approaches to control the microstructure of materials, such as annealing, require
high temperature treatment for long periods of time. In this study, we present a room …

Effect of high current density pulses on performance enhancement of optoelectronic devices

MH Rahman, N Glavin, A Haque, F Ren… - ECS Journal of Solid …, 2024 - iopscience.iop.org
Thermal annealing is commonly used in fabrication processing and/or performance
enhancement of electronic and opto-electronic devices. In this study, we investigate an …

Origin of the diffusion-related optical degradation of 1.3 μm InAs QD-LDs epitaxially grown on silicon substrate

M Buffolo, F Lain, M Zenari, C De Santi… - IEEE Journal of …, 2021 - ieeexplore.ieee.org
This paper investigates the origin of the diffusion process responsible for the optical
degradation of InAs quantum dot (QD) laser diodes epitaxially grown on silicon. By means of …

Similarity-based difference analysis approach for remaining useful life prediction of GaAs-based semiconductor lasers

Z Liu, Q Wang, C Song, Y Cheng - IEEE Access, 2017 - ieeexplore.ieee.org
Recently, the analysis of remaining useful life (RUL), which is central to the reliability
assessment of lasers under various environment stresses, has become one of the most …

Reliability of high performance 9xx-nm single emitter laser diodes

L Bao, J Wang, M DeVito, D Xu, D Wise… - High-Power Diode …, 2010 - spiedigitallibrary.org
This paper presents reliable high power and high brightness 9xx-nm single emitter laser
diodes, which have been designed for various multi-emitter fiber-coupled modules. Diode …

High reliability and high performance of 9xx-nm single emitter laser diodes

L Bao, P Leisher, J Wang, M Devito… - High-Power Diode …, 2011 - spiedigitallibrary.org
Improved performance and reliability of 9xx nm single emitter laser diodes are presented. To
date, over 15,000 hours of accelerated multi-cell lifetest reliability data has been collected …