This article examines recent advances in the field of antiferromagnetic spintronics from the
perspective of potential device realization and applications. We discuss advances in the …

Scanning transmission electron microscopy (STEM) is one of the most powerful
characterization tools in materials science research. Due to instrumentation developments …

Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

It has been known since the 1970s that the movement of the center of mass (COM) of a
convergent beam electron diffraction (CBED) pattern is linearly related to the (projected) …

We describe a hybrid pixel array detector (electron microscope pixel array detector, or
EMPAD) adapted for use in electron microscope applications, especially as a universal …

Characterizing magnetic structures down to atomic dimensions is central to the design and
control of nanoscale magnetism in materials and devices. However, real-space visualization …

In scanning transmission electron microscopy (STEM), single atoms can be imaged by
detecting electrons scattered through high angles using post-specimen, annular-type …

Differential phase contrast images in scanning transmission electron microscopy can be
directly and quantitatively related to the gradient of the projected specimen potential …

This study sheds light on the prerequisites, possibilities, limitations and interpretation of high-
resolution differential phase contrast (DPC) imaging in scanning transmission electron …

In superconductors, the motion of vortices introduces unwanted dissipation that is disruptive
to applications. Fortunately, material defects can immobilize vortices, acting as vortex …