Conductive bridging random access memory—materials, devices and applications

MN Kozicki, HJ Barnaby - Semiconductor Science and …, 2016‏ - iopscience.iop.org
We present a review and primer on the subject of conductive bridging random access
memory (CBRAM), a metal ion-based resistive switching technology, in the context of current …

Investigating the origins of ultra-short relaxation times of silver filaments in forming-free SiO2-based conductive bridge memristors

P Bousoulas, D Sakellaropoulos… - …, 2020‏ - iopscience.iop.org
The threshold switching effect is considered of outmost importance for a variety of
applications ranging from the reliable operation of crossbar architectures to emulating …

SiO2 based conductive bridging random access memory

W Chen, S Tappertzhofen, HJ Barnaby… - Journal of …, 2017‏ - Springer
We present a review on the subject of Conductive Bridging Random Access Memory
(CBRAM) based on copper-or silver-doped silicon dioxide. CBRAM is a promising type of …

Resistive switching study on diffusive memristors using electrochemical impedance spectroscopy

A Gabbitas, DP Pattnaik, Z Zhou… - Journal of Physics D …, 2023‏ - iopscience.iop.org
Diffusive memristors demonstrate volatile resistive switching powered by the diffusion of
silver nanoparticles through the matrix of silicon dioxide. The equivalent circuit of the high …

[HTML][HTML] Robust hybrid perovskite self-rectifying memristor for brain-inspired computing and data storage

M Khemnani, M Jain, D Hirpara, M Kumar… - Journal of Applied …, 2025‏ - pubs.aip.org
Conventional computing architectures are not suited to meet the unique workload
requirements of artificial intelligence and deep learning, which has sparked a growing …

Steep-slope field-effect transistors with AlGaN/GaN HEMT and oxide-based threshold switching device

X Huang, R Fang, C Yang, K Fu, H Fu, H Chen… - …, 2019‏ - iopscience.iop.org
We report the demonstration of a steep-slope field-effect transistor with AlGaN/GaN MIS-
HEMTs employing SiO 2-based threshold switching devices in series with the source. The …

Possible equivalent circuit model and physical structures of sputter-deposited silicon oxide film showing resistive switching

Y Omura - ECS Journal of Solid State Science and Technology, 2021‏ - iopscience.iop.org
Based on the results of experiments on the resistive switching behaviors of sputter-
deposited silicon oxide films, this paper proposes a possible equivalent circuit model to …

Filament behaviour and stability in ECM memristive devices studied by electrochemical impedance spectroscopy

C Weber, I Valov - … Symposium on Circuits and Systems (ISCAS …, 2023‏ - ieeexplore.ieee.org
The filament in the electrochemical metallization memories (ECM/CBRAM)[1],[2] and
valence change memory (VCM/OxRAM)[2],[3] devices defines the low resistive state (LRS) …

Non-volatile resistive switching in oxide ion conductor BiYO3 thin films

D Bhatnagar, A Kumar, K Prabahar, M Suri… - Applied Physics …, 2018‏ - pubs.aip.org
We experimentally demonstrate non-volatile resistive switching (RS) with a resistance
window of∼ 10× in oxide ion conductor BiYO 3 (BYO) thin films.(111)-oriented BYO films of …

[کتاب][B] Cu-silica based programmable metallization cell: fabrication, characterization and applications

W Chen - 2017‏ - search.proquest.com
Abstract The Programmable Metallization Cell (PMC) is a novel solid-state resistive
switching technology. It has a simple metal-insulator-metal “MIM” structure with one metal …