Genome-wide association studies (GWAS) are effectively applied to detect the marker trait
associations (MTAs) using whole genome-wide variants for complex quantitative traits in …

Adult-plant resistance (APR) is a type of genetic resistance in cereals that is effective during
the later growth stages and can protect plants from a range of disease-causing pathogens …

Key message A total of 19 meta-QTL conferring resistance to tan spot were identified from
104 initial QTL detected in 15 previous QTL map** studies. Abstract Tan spot, caused by …

The rate of advancement made in phenomic-assisted breeding methodologies has lagged
those of genomic-assisted techniques, which is now a critical component of mainstream …

Tan spot, caused by the fungus Pyrenophora tritici-repentis (Ptr), is a severe foliar disease of
wheat (Triticum aestivum L.). Improving genetic resistance is a durable strategy to reduce Ptr …

Core Ideas First genome‐wide association map** of adult plant Septoria nodorum blotch
resistance. Some adult plant resistance loci were shared with seedling resistance loci. Other …

In wheat, major yield losses are caused by a variety of diseases including rusts, spike
diseases, leaf spot and root diseases. The genetics of resistance against all these diseases …

Key message QTL map** identified key genomic regions associated with adult-plant
resistance to tan spot, which are effective even in the presence of the sensitivity gene Tsn1 …

Key message Resistance to tan spot in durum wheat involves race-nonspecific QTL and
necrotrophic insensitivity gene. Abstract Tan spot, caused by the necrotrophic fungus …

Stripe rust caused by Puccinia striiformis f. sp. tritici (Pst) is one of the most devastating foliar
diseases in wheat. Host resistance is the most effective strategy for the management of the …