Copper bonding technology in heterogeneous integration

YG Lee, M McInerney, YC Joo, IS Choi… - Electronic Materials …, 2024 - Springer
As semiconductor device scaling faces a severe technical bottleneck, vertical die stacking
technologies have been developed to obtain high performance, high density, low latency …

Wafer-to-wafer hybrid bonding development by advanced finite element modeling for 3-D IC packages

L Ji, FX Che, HM Ji, HY Li… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
This article focuses on the 3-D modeling methodology development of the wafer-to-wafer
hybrid bonding (W2W-HB) annealing process. With its successful application in a 2-stack …

Thermodynamic modeling framework with experimental investigation of the large-scale bonded area and local void in Cu-Cu bonding interface for advanced …

SH Oh, HD Lee, JU Lee, SH Park, WS Cho… - International Journal of …, 2024 - Elsevier
With the increase in computational costs driven by the use of artificial intelligence,
enhancing the performance of semiconductor systems while improving efficiency has …

Optimization of Cu protrusion of wafer-to-wafer hybrid bonding for HBM packages application

S Wang, H Zhang, Z Tian, T Liu, Y Sun, Y Zhang… - Materials Science in …, 2022 - Elsevier
This work focuses on the effect of Cu protrusion on the reliability of High Bandwidth Memory
(HBM) fabricated by wafer-to-wafer hybrid bonding (W2W-HB) process. The thermal stress …

Advanced Cu/Polymer Hybrid Bonding System for Fine‐Pitch 3D Stacking Devices

J Park, S Kang, ME Kim, NJ Kim, J Kim… - Advanced Materials …, 2023 - Wiley Online Library
Hybrid bonding enables the commercialization of ultra‐fine pitch high‐density 3D packages.
Cu/SiO2 hybrid bonding is the standard packing interface recently introduced in the industry …

Area-selective electroless deposition of Cu for hybrid bonding

F Inoue, S Iacovo, Z El-Mekki, SW Kim… - IEEE Electron …, 2021 - ieeexplore.ieee.org
This letter describes the use of area-selective electroless Cu deposition for topography
control of Cu-SiCN hybrid bonding pads. The electroless deposition of Cu allows one to …

Thermal modeling of a chiplet-based packaging with a 2.5-D through-silicon via interposer

M Zhou, L Li, F Hou, G He, J Fan - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Chiplet-based packaging technology integrates multiple heterogeneous dies with different
functions and materials into a single system as a LEGO-based approach using advanced …

Mechanism and process window study for die-to-wafer (D2W) hybrid bonding

H Ren, YT Yang, G Ouyang… - ECS Journal of Solid State …, 2021 - iopscience.iop.org
Room temperature hybrid bonding is a good candidate to replace thermal compression
bonding due to its better resistance to Cu oxidation and its capability for large die …

3D Integration via D2D Bump-Less Cu Bonding with Protruded and Recessed Topographies

A Roshanghias, J Kaczynski, A Rodrigues… - ECS Journal of Solid …, 2023 - iopscience.iop.org
Bump-less copper (Cu) bonding is currently the most attractive approach for fine-pitch (< 20
μm) 3D integration due to its compatibility with the wafer back-end-of-the-line (BEOL) …

Development of copper thermal coefficient for low temperature hybrid bonding

S Dag, M Liu, L Jiang, A Kiaee, G See… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
We present a modeling framework to guide the development and optimization of the hybrid
bonding process. The key challenge is to achieve fully-bonded Cu-Cu metal interfaces/pads …