A deep learning (DL) technique to extract the set of Berkeley short-channel IGFET model-
common multigate (BSIM-CMG) compact model parameters directly from experimental …

The utilization of Bayesian methods has been widely acknowledged as a viable solution for
tackling various challenges in electronic integrated circuit (IC) design under stochastic …

Abstract Machine learning is transforming many industries and areas of work, and the
design of very large-scale integrated (VLSI) circuits and systems is no exception. The …

Parametric yield estimation is a critical task for design and validation of analog and mixed-
signal (AMS) circuits. However, the computational cost for yield estimation based on Monte …

Faster and more accurate variation characterizations of semiconductor devices/circuits are
in great demand as process technologies scale down to Fin-FET era. Traditional methods …

Photonic systems are being developed with extensions to existing CMOS processes, and
are growing in complexity. Silicon photonics designs are evaluated in simulation using …

▪ P (B) is usually not explicitly needed (or sometimes difficult to evaluate)▪ Only P (A) and P
(B| A) are needed, as P (A, B)= P (A) P (B| A) and next integration/summation marginalizes …