Microscopic models for charge-noise-induced dephasing of solid-state qubits

F Beaudoin, WA Coish - Physical Review B, 2015 - APS
Several experiments have shown qubit coherence decay of the form exp [−(t/T 2) α] due to
environmental charge-noise fluctuations. We present a microscopic description for …

Single-electron capacitance spectroscopy of individual dopants in silicon

M Gasseller, M DeNinno, R Loo, JF Harrison… - Nano …, 2011 - ACS Publications
Motivated by recent transport experiments and proposed atomic-scale semiconductor
devices, we present measurements that extend the reach of scanned-probe methods to …

[書籍][B] Understanding and suppressing dephasing noise in semiconductor qubits

F Beaudoin - 2016 - search.proquest.com
Magnetic-field gradients and microwave resonators are promising tools to realize a scalable
quantum-computing architecture with spin qubits. Indeed, magnetic-field gradients allow fast …

Scanning-probe single-electron capacitance spectroscopy

KA Walsh, ME Romanowich… - Journal of …, 2013 - pmc.ncbi.nlm.nih.gov
The integration of low-temperature scanning-probe techniques and single-electron
capacitance spectroscopy represents a powerful tool to study the electronic quantum …

[書籍][B] Scanning probe spectroscopy of individual dopants in silicon

M Gasseller - 2010 - search.proquest.com
I have applied a novel scanned probe method called Charge Accumulation Imaging
technique (CAI) to study the electronic states of individual boron dopants in silicon. In …