[HTML][HTML] High-k/Ge MOSFETs for future nanoelectronics

Y Kamata - Materials today, 2008 - Elsevier
Recently developed high-permittivity (k) materials have reopened the door to Ge as a
channel material in metal-oxide-semiconductor field-effect transistors (MOSFETs). High-k/Ge …

Germanium based field-effect transistors: Challenges and opportunities

PS Goley, MK Hudait - Materials, 2014 - mdpi.com
The performance of strained silicon (Si) as the channel material for today's metal-oxide-
semiconductor field-effect transistors may be reaching a plateau. New channel materials …

Synthesis and characterization of hexagonal boron nitride as a gate dielectric

SK Jang, J Youn, YJ Song, S Lee - Scientific reports, 2016 - nature.com
Two different growth modes of large-area hexagonal boron nitride (h-BN) film, a
conventional chemical vapor deposition (CVD) growth mode and a high-pressure CVD …

Germanium surface passivation and atomic layer deposition of high-k dielectrics—a tutorial review on Ge-based MOS capacitors

Q **e, S Deng, M Schaekers, D Lin… - Semiconductor …, 2012 - iopscience.iop.org
Due to its high intrinsic mobility, germanium (Ge) is a promising candidate as a channel
material (offering a mobility gain of approximately× 2 for electrons and× 4 for holes when …

Direct evidence of GeO volatilization from GeO2/Ge and impact of its suppression on GeO2/Ge metal–insulator–semiconductor characteristics

K Kita, S Suzuki, H Nomura, T Takahashi… - Japanese journal of …, 2008 - iopscience.iop.org
From the studies on the thermal desorption behaviors of GeO 2 film and its impact on the
electrical properties of GeO 2/Ge metal–insulator–semiconductor (MIS) capacitors, it was …

Hafnium oxide gate dielectrics on sulfur-passivated germanium

MM Frank, SJ Koester, M Copel, JA Ott… - Applied physics …, 2006 - pubs.aip.org
Sulfur passivation of Ge (100) is achieved using aqueous ammonium sulfide (NH 4) 2 S
(aq)⁠. The passivation layer is largely preserved after atomic layer deposition of the high-κ …

Ge diffusion in Ge metal oxide semiconductor with chemical vapor deposition HfO2 dielectric

N Lu, W Bai, A Ramirez, C Mouli, A Ritenour… - Applied Physics …, 2005 - pubs.aip.org
We report a study on Ge diffusion and its impact on the electrical properties of Ta N∕ Hf O
2∕ Ge metal-oxide-semiconductor (MOS) device. It is found that Ge diffusion depends on …

Design and simulation of triple metal double-gate germanium on insulator vertical tunnel field effect transistor

T Chawla, M Khosla, B Raj - Microelectronics journal, 2021 - Elsevier
In this paper, a novel Triple metal double gate germanium on insulator vertical TFET is
proposed and investigated by using SILVACO ATLAS TCAD tool. Gate metal work-function …

Ge (001) surface cleaning methods for device integration

P Ponath, AB Posadas, AA Demkov - Applied Physics Reviews, 2017 - pubs.aip.org
Germanium (Ge), with its higher hole and electron mobility than silicon, is a promising
candidate to replace silicon for future complementary metal-oxide-semiconductor (CMOS) …

Atomic layer deposition of dielectrics on Ge and III–V materials for ultrahigh performance transistors

RM Wallace, PC McIntyre, J Kim, Y Nishi - MRS bulletin, 2009 - cambridge.org
The prospect of utilizing alternative transistor channel materials for ultrahigh performance
transistors will require suitable gate dielectrics for surface-channel field-effect devices. With …