No silicon integrated circuit (IC) manufacturing process is perfect. Therefore, IC testing is
used to screen imperfect devices before ship** them to customers. Chips containing …

This paper describes a novel functional Built-in-Self-Test (BIST) method for microprocessors.
This technique is based on the fundamental principle that complex chips have embedded …

Design validation is a critical step in the development of present-day microprocessors, and
some authors suggest that up to 60% of the design cost is attributable to this activity. Of the …

Software-based self-test (SBST) has recently emerged as an effective methodology for the
manufacturing test of processors and other components in systems-on-chip (SoCs). By …

This paper describes μ GP, an evolutionary approach for generating assembly programs
tuned for a specific microprocessor. The approach is based on three clearly separated …

Microprocessor cores are a major challenge in the test arena: not only is their complexity
always increasing, but also their specific characteristics intensify all difficulties. A …

Software-based or instruction-based self-testing has recently emerged as an effective
alternative for the manufacturing and online testing of microprocessors, and is progressively …

Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded
processors. Embedded processors are regularly used today in most System-on-Chips …

Software based self-testing of embedded processor cores provides an excellent technique
for balancing the testing effort for complex Systems-on-Chip (SoC) between slow …

Software self-testing for embedded processor cores based on their instruction set, is a topic
of increasing interest since it provides an excellent test resource partitioning technique for …