Microelectronic properties of organic Schottky diodes based on MgPc for solar cell applications

I Missoum, YS Ocak, M Benhaliliba, CE Benouis… - Synthetic Metals, 2016 - Elsevier
The magnesium phthalocyanine (MgPc) based Schottky diodes are fabricated using four
inorganic semiconductors (n-GaAs, n-Si, p-InP, p-Si) by the spin-coating process at 2000 …

The barrier height inhomogeneity in Al/p-Si Schottky barrier diodes with native insulator layer

İ Dökme, Ş Altindal, MM Bülbül - Applied surface science, 2006 - Elsevier
The current–voltage (I–V) characteristics of Al/p-Si Schottky barrier diodes (SBDs) with
native insulator layer were measured in the temperature range of 150–375K. The estimated …

Significant enhancement in photosensitivity, responsivity, detectivity and quantum efficiency of Co3O4 nanostructured thin film-based photodetectors through Mo …

R Marnadu, M Shkir, J Hakami, IM Ashraf… - Surfaces and …, 2022 - Elsevier
Herein, we have developed the high-performance photodetector diodes (p-Co 3 O4/n-Si and
p-Mo@ Co 3 O 4/n-Si) by spray pyrolysis route for modern optoelectronic devices. The …

Current transport mechanism in Al/Si3N4/p-Si (MIS) Schottky barrier diodes at low temperatures

S Zeyrek, Ş Altındal, H Yüzer, MM Bülbül - Applied Surface Science, 2006 - Elsevier
The current–voltage (I–V) and capacitance–voltage (C–V) characteristics of metal–insulator–
semiconductor (Al/Si3N4/p-Si) Schottky barrier diodes (SBDs) were measured in the …

Characterization of current–voltage (I–V) and capacitance–voltage–frequency (C–V–f) features of Al/SiO2/p-Si (MIS) Schottky diodes

A Tataroğlu, Ş Altındal - Microelectronic engineering, 2006 - Elsevier
The current–voltage (I–V) characteristics of metal–insulator–semiconductor Al/SiO2/p-Si
(MIS) Schottky diodes were measured at room temperature (300K). In addition, capacitance …

Electrical transport characteristics of Sn/p-Si schottky contacts revealed from I–V–T and C–V–T measurements

Ş Karataş, Ş Altındal, A Türüt, M Çakar - Physica B: Condensed Matter, 2007 - Elsevier
The current–voltage (I–V) and capacitance–voltage (C–V) characteristics of metal–
semiconductor (Sn/p-Si) Schottky contacts were measured in the temperature range 150 …

The role of the interface insulator layer and interface states on the current-transport mechanism of Schottky diodes in wide temperature range

Ş Altındal, İ Dökme, MM Bülbül, N Yalçın… - Microelectronic …, 2006 - Elsevier
In order to interpret in detail the experimentally observed current–voltage–temperature (I–V–
T) and capacitance–voltage–temperature (C–V–T) results of Al/p-Si metal–semiconductor …

Temperature dependence of characteristic parameters of the Au/SnO2/n-Si (MIS) Schottky diodes

M Özer, DE Yıldız, Ş Altındal, MM Bülbül - Solid-State Electronics, 2007 - Elsevier
The variation in electrical characteristics of Au/SnO2/n-Si (MIS) Schottky diodes have been
systematically investigated as a function of temperature by using forward bias current …

The double Gaussian distribution of barrier heights in Al/TiO2/p-Si (metal-insulator-semiconductor) structures at low temperatures

O Pakma, N Serin, T Serin, Ş Altındal - Journal of Applied Physics, 2008 - pubs.aip.org
The current-voltage (IV) characteristics of Al/TiO 2/p-Si metal-insulator-semiconductor (MIS)
structures have been investigated in the temperature range of 80–300 K. An abnormal …

The influence of high energy electron irradiation on the Schottky barrier height and the Richardson constant of Ni/4H-SiC Schottky diodes

E Omotoso, WE Meyer, FD Auret, AT Paradzah… - Materials Science in …, 2015 - Elsevier
The influence of high energy electron (HEE) irradiation from a Sr-90 radio-nuclide on n-type
Ni/4H–SiC samples of do** density 7.1× 10 15 cm− 3 has been investigated over the …