Built-in self-test (BIST) methods for MEMS: A review

G Hantos, D Flynn, MPY Desmulliez - Micromachines, 2020 - mdpi.com
A novel taxonomy of built-in self-test (BIST) methods is presented for the testing of micro-
electro-mechanical systems (MEMS). With MEMS testing representing 50% of the total costs …

[BUCH][B] System-on-chip test architectures: nanometer design for testability

LT Wang, CE Stroud, NA Touba - 2010 - books.google.com
Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

Design of a Novel Self-Test-on-Chip Interface ASIC for Capacitive Accelerometers

X Li, P Wang, G Li, Y Zhang - IEEE Transactions on Circuits and …, 2023 - ieeexplore.ieee.org
High-precision miniaturized micromechanical accelerometers are used extensively in the
civilian and military fields. A novel self-test-on-chip method and time-multiplexing feedback …

Carnot cycle for an oscillator

J Arnaud, L Chusseau, F Philippe - European journal of physics, 2002 - iopscience.iop.org
In 1824 Carnot established that the efficiency of cyclic engines operating between a hot bath
at absolute temperature T hot and a bath at a lower temperature T cold cannot exceed 1− T …

Auto-calibration of capacitive MEMS accelerometers based on pull-in voltage

LA Rocha, RA Dias, E Cretu, L Mol… - Microsystem …, 2011 - Springer
This paper describes an electro-mechanical auto-calibration technique for use in capacitive
MEMS accelerometers. Auto-calibration is achieved using the combined information derived …

Nondestructive gap dimension estimation of electrostatic MEMS resonators from electrical measurements

A Brenes, B Vysotskyi, E Lefeuvre, J Juillard - Mechanical Systems and …, 2018 - Elsevier
This paper proves that critical geometric dimensions of a capacitive resonator can be
estimated from nondestructive electrical measurements. In particular, the gap between the …

An electrical-stimulus-only BIST IC for capacitive MEMS accelerometer sensitivity characterization

MK Ozel, M Cheperak, T Dar, S Kiaei… - IEEE Sensors …, 2016 - ieeexplore.ieee.org
Testing and calibration constitute a major part of the overall manufacturing cost of
microelectromechanical system (MEMS) devices. A physical-stimulus-free built-in-selftest …

A package for piezoresistive pressure sensors with embedded built-in self-test function based on bimetallic actuator

C **e, J Li, W Wang - Sensors and Actuators A: Physical, 2022 - Elsevier
Piezoresistive pressure sensors have been widely used in the industry and many other
fields. However, conventional pressure sensor inspection is performed with the device off …

A built-in self-test and self-adjustment method of MEMS pressure sensor

M Zhu, J Li, W Wang, D Chen - Microelectronics Reliability, 2022 - Elsevier
MEMS device degradation due to aging and other factors is becoming a major concern
because it will cause parametric deviations and catastrophic failures in the mechanical and …

Real-time built-in self-test of MEMS gyroscope based on quadrature error signal

R Feng, J Wang, W Qiao, F Wang, M Zhou, X Shang… - Micromachines, 2021 - mdpi.com
In high-reliability applications, the health condition of the MEMS gyroscope needs to be
known in real time to ensure that the system does not fail due to the wrong output signal …