This work presents a comprehensive review on radiation hardening techniques aimed at
enhancing the resilience of VLSI circuits against soft errors. The study covers a wide …

Radiation Hardened by Design (RHBD) is one of the main measures for solving the soft
error issue in digital circuits. However, a multi-objective optimization (MOO) problem …

Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event
Transient (SET) effects were considered irrelevant compared to the data rupture caused by …

The aggressive technology scaling has significantly affected the circuit reliability. The
interaction of environmental radiation with the devices in the integrated circuits (ICs) may be …

With the continuous scaling-down of transistors, the soft error issue of the combinational
circuit becomes more serious. Triple Modular Redundancy (TMR) and Gate-Sizing (GS) are …

Soft errors in Integrated Circuits (ICs) have always been a major concern, particularly as
CMOS technology nodes continue to shrink, resulting in higher frequency, lower power, and …

The radiation effects on a multi-nanosheet tunneling-based field effect transistor (NS-TFET)
were investigated for a 3-nm technology node using a three-dimensional (3D) technology …

The downsizing of nanoscale circuits imposes new challenges for circuit reliability, including
hard defects, soft errors and unsaturated voltage/current. Many studies on the reliability of …

A differential fault tolerance encoding is presented for finite state machines (FSMs) to
improve their area efficiency. As the manufacturing technology for semiconductors continues …

The high energy particles in the space environment will perturb integrated circuits, resulting
in system errors or even failures, which is also known as single event effects (SEE). To …