Machine learning in scanning transmission electron microscopy

SV Kalinin, C Ophus, PM Voyles, R Erni… - Nature Reviews …, 2022 - nature.com
Scanning transmission electron microscopy (STEM) has emerged as a uniquely powerful
tool for structural and functional imaging of materials on the atomic level. Driven by …

Deep learning in electron microscopy

JM Ede - Machine Learning: Science and Technology, 2021 - iopscience.iop.org
Deep learning is transforming most areas of science and technology, including electron
microscopy. This review paper offers a practical perspective aimed at developers with …

Applications of Transmission Electron Microscopy in Phase Engineering of Nanomaterials

G Li, H Zhang, Y Han - Chemical Reviews, 2023 - ACS Publications
Phase engineering of nanomaterials (PEN) is an emerging field that aims to tailor the
physicochemical properties of nanomaterials by precisely manipulating their crystal phases …

Differentiating polymorphs in molybdenum disulfide via electron microscopy

X Zhao, S Ning, W Fu, SJ Pennycook… - Advanced …, 2018 - Wiley Online Library
The presence of rich polymorphs and stacking polytypes in molybdenum disulfide (MoS2)
endows it with a diverse range of electrical, catalytic, optical, and magnetic properties. This …

Deep Learning‐Assisted Quantification of Atomic Dopants and Defects in 2D Materials

SH Yang, W Choi, BW Cho… - Advanced …, 2021 - Wiley Online Library
Atomic dopants and defects play a crucial role in creating new functionalities in 2D transition
metal dichalcogenides (2D TMDs). Therefore, atomic‐scale identification and their …

Sub-sampled imaging for STEM: Maximising image speed, resolution and precision through reconstruction parameter refinement

D Nicholls, J Wells, A Stevens, Y Zheng, J Castagna… - Ultramicroscopy, 2022 - Elsevier
Sub-sampling during image acquisition in scanning transmission electron microscopy
(STEM) has been shown to provide a means to increase the overall speed of acquisition …

Image registration of low signal-to-noise cryo-STEM data

BH Savitzky, I El Baggari, CB Clement, E Waite… - Ultramicroscopy, 2018 - Elsevier
Combining multiple fast image acquisitions to mitigate scan noise and drift artifacts has
proven essential for picometer precision, quantitative analysis of atomic resolution scanning …

Reducing electron beam damage through alternative STEM scanning strategies, part I: experimental findings

A Velazco, A Béché, D Jannis, J Verbeeck - Ultramicroscopy, 2022 - Elsevier
The highly energetic electrons in a transmission electron microscope (TEM) can alter or
even completely destroy the structure of samples before sufficient information can be …

Three-dimensional electron tomography and recent expansion of its applications in materials science

N Baba, S Hata, H Saito, K Kaneko - Microscopy, 2023 - academic.oup.com
Electron tomography (ET) is a powerful tool for elucidating the properties and functionalities
of materials. The innovative development of aberration-corrected electron microscopy in the …

Advances and Opportunities in Closed Gas-Cell Transmission Electron Microscopy

K Koo, Y Liu, Y Cheng, Z Cai, X Hu… - Chemistry of …, 2024 - ACS Publications
Direct in situ characterizations of the solid–fluid interface on the nanoscale can provide
profound implications for addressing bulk-scale enigmas. The advent of closed-cell …