Modeling spatial variation is important for statistical analysis. Most existing works model
spatial variation as spatially correlated random variables. We discuss process origins of …

A physics-informed deep learning-based scheme is introduced for computing partial
inductances of interconnects. This scheme takes a physics-based skin depth map and a …

The explosive growth of the semiconductor industry over the past decade has been driven
by the rapid scaling of complementary metal-oxide-semiconductor (CMOS) technology …

In this paper we study statistics of statistics. Statistical modeling and analysis have become
the mainstay of modern design-manufacturing flows. Most analysis techniques assume that …