Carrier lifetime and breakdown phenomena in SiC power device material

T Kimoto, H Niwa, T Okuda, E Saito… - Journal of Physics D …, 2018 - iopscience.iop.org
Recent progress and current understanding of carrier lifetimes and avalanche phenomena
in silicon carbide (SiC) are reviewed. The acceptor level of carbon vacancy (VC), called the …

Impact ionization coefficients of 4H silicon carbide

T Hatakeyama, T Watanabe, T Shinohe… - Applied physics …, 2004 - pubs.aip.org
Anisotropy of the impact ionization coefficients of 4H silicon carbide is investigated by
means of the avalanche breakdown behavior of p+n diodes on (0001) and 112 0 4H silicon …

Theory of high field carrier transport and impact ionization in wurtzite GaN. Part I: A full band Monte Carlo model

F Bertazzi, M Moresco, E Bellotti - Journal of Applied Physics, 2009 - pubs.aip.org
High field electron and hole transport in wurtzite phase GaN is studied using an ensemble
Monte Carlo method. The model includes the details of the full band structure derived from …

Theory of carriers transport in III-nitride materials: State of the art and future outlook

E Bellotti, F Bertazzi, S Shishehchi… - IEEE transactions on …, 2013 - ieeexplore.ieee.org
In this paper, we describe the state of the art in the numerical simulation of the carrier
transport properties of GaN and its ternary alloys. We outline the characteristics of our state …

Impact ionization coefficients in 4H-SiC

WS Loh, BK Ng, JS Ng, SI Soloviev… - … on electron devices, 2008 - ieeexplore.ieee.org
Photomultiplication measurements using 244-and 325-nm excitation have been undertaken
on a series of thick 4H-SiC avalanche diodes. With avalanche widths of between 2.7 and 6 …

Theoretical study on high-field carrier transport and impact ionization coefficients in 4H-SiC

H Tanaka, T Kimoto, N Mori - Materials Science in Semiconductor …, 2024 - Elsevier
The high-field carrier transport properties of 4H-SiC including the impact ionization
coefficients are theoretically analyzed based on a full-band Monte Carlo simulation. The …

A numerical study of carrier impact ionization in AlxGa1− xN

E Bellotti, F Bertazzi - Journal of Applied Physics, 2012 - pubs.aip.org
Using a full-band Monte Carlo model we have computed the carrier impact ionization
coefficients in Al x Ga 1− x N for seven alloy compositions between x= 0 (GaN) and x= 1.0 …

Physical models for SiC and their application to device simulations of SiC insulated-gate bipolar transistors

T Hatakeyama, K Fukuda… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
Important physical models for 4H silicon carbide (4H-SiC) are constructed based on the
literature and experiments on the physical properties of 4H-SiC. The obtained physical …

Monte Carlo study of high-field carrier transport in -SiC including band-to-band tunneling

M Hjelm, HE Nilsson, A Martinez, KF Brennan… - Journal of applied …, 2003 - pubs.aip.org
A full-band ensemble Monte Carlo simulation has been used to study the high-field carrier
transport properties of 4H-SiC. The complicated band structure of 4H-SiC requires the …

Measurements of impact ionization coefficients of electrons and holes in 4H‐SiC and their application to device simulation

T Hatakeyama - physica status solidi (a), 2009 - Wiley Online Library
This article is intended to review measurements and modeling of anisotropic impact
ionization coefficients of electrons and holes in 4H‐SiC. Owing to the hexagonal crystal …