Optimizing network security with machine learning and multi-factor authentication for enhanced intrusion detection

RK Mahmood, AI Mahameed, NQ Lateef… - Journal of Robotics …, 2024 - journal.umy.ac.id
This study examines the utilization of machine learning methodologies and multi-factor
authentication (MFA) to bolster network security, specifically targeting network intrusion …

DAMO: Deep agile mask optimization for full chip scale

G Chen, W Chen, Y Ma, H Yang, B Yu - Proceedings of the 39th …, 2020 - dl.acm.org
Continuous scaling of the VLSI system leaves a great challenge on manufacturing, thus
optical proximity correction (OPC) is widely applied in conventional design flow for …

Flowtune: Practical multi-armed bandits in boolean optimization

C Yu - Proceedings of the 39th International Conference on …, 2020 - dl.acm.org
Recent years have seen increasing employment of decision intelligence in electronic design
automation (EDA), which aims to reduce the manual efforts and boost the design closure …

Neural-ILT 2.0: Migrating ILT to domain-specific and multitask-enabled neural network

B Jiang, L Liu, Y Ma, B Yu… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
Optical proximity correction (OPC) in modern design closures has become extremely
expensive and challenging. Conventional model-based OPC encounters performance …

Label-free neural networks-based inverse lithography technology

JT Chen, YY Zhao, Y Zhang, JX Zhu, XM Duan - Optics Express, 2022 - opg.optica.org
Neural network-based inverse lithography technology (NNILT) has been used to improve
the computational efficiency of large-scale mask optimization for advanced …

Deep learning-driven digital inverse lithography technology for DMD-based maskless projection lithography

JT Chen, YY Zhao, X Guo, XM Duan - Optics & Laser Technology, 2025 - Elsevier
Digital micromirror device (DMD)-based maskless projection lithography has gained
significant attention for its maskless, flexible, and cost-effective characteristics. However …

Techniques for CAD tool parameter auto-tuning in physical synthesis: A survey

H Geng, T Chen, Q Sun, B Yu - 2022 27th Asia and South …, 2022 - ieeexplore.ieee.org
As the technology node of integrated circuits rapidly goes beyond 5nm, synthesis-centric
modern very large-scale integration (VLSI) design flow is facing ever-increasing design …

An imbalance aware lithography hotspot detection method based on HDAM and pre-trained GoogLeNet

K Zhou, K Zhang, J Liu, Y Liu, S Liu… - Measurement Science …, 2021 - iopscience.iop.org
Due to the continuous shrinkage of transistor size and the ever-increasing complexity of
integrated circuit design layout, great challenges arise in optical lithography—any defect on …

Efficient nonlinear resist modeling by combining and cascading quadratic Wiener systems

C Mu, L Cheng, S Zhang, H Jiang, DH Wei… - Optics & Laser …, 2025 - Elsevier
Optical proximity correction (OPC) is currently a crucial technique for improving
photolithographic image quality, with its correctness and efficiency relying heavily on resist …

OpenILT: An open source inverse lithography technique framework

S Zheng, B Yu, M Wong - 2023 IEEE 15th International …, 2023 - ieeexplore.ieee.org
Semiconductor lithography is a key process for fabricating integrated circuits, but it suffers
from various distortions and variations that affect the quality of the printed patterns. Optical …