Electrochemical migration is a critical factor contributing to failures in electronics due to
humidity. When moisture accumulates on conductor-dielectric-conductor systems under bias …

In spectroscopic ellipsometry, the optical properties of materials are obtained indirectly by
generally assuming dielectric function and optical models. This ellipsometry analysis, which …

In this comprehensive study, we synthesized Co0. 6Zn0. 4Fe2O4 cubic spinel via the sol–
gel method and characterized its structural, thermal, and optical properties. X-ray diffraction …

A method has been developed for optical monitoring of spectrally selective solar radiation
absorber coatings with a high absorption coefficient obtained by thermal oxidation of metal …

The morphological evolution of Ge layers growing on the SiO 2/Si (100) substrate by photo-
excited chemical vapor deposition was traced through an analysis of pseudodielectric …

Indirect optical methods like ellipsometry or scatterometry require an optical model to
calculate the response of the system, and to fit the parameters in order to minimize the …

The research on solar cells based on photonic, plasmonic and various nanostructured
materials has been increasing in the recent years. A wide range of nanomaterial …

This chapter focuses on the optical modeling of oxides and oxide-based structures using
spectroscopic ellipsometry. The parameterization of the dielectric function will be discussed …

Разработан и протестирован спектрально-эллипсометрический метод
неразрушающего контроля фазового состава многослойных плёнок и металл …

Optical methods have been used for the sensitive characterization of surfaces and thin films
for more than a century. The first ellipsometric measurement was conducted on metal …