[HTML][HTML] Reactive sputtering of aluminum nitride (002) thin films for piezoelectric applications: A review

A Iqbal, F Mohd-Yasin - Sensors, 2018 - mdpi.com
We summarize the recipes and describe the role of sputtering parameters in producing
highly c-axis Aluminum Nitride (AlN) films for piezoelectric applications. The information is …

Reactive magnetron sputtered AlN thin films: structural, linear and nonlinear optical characteristics

HA Alyousef, AM Hassan, HMH Zakaly - Journal of Materials Science …, 2023 - Springer
This study investigates the structural and optical characteristics of aluminum nitride (AlN)
thin films deposited using reactive magnetron sputtering (dcMS) in an Ar+ N2 (80: 20%) …

Piezoelectric aluminum nitride thin films for CMOS compatible MEMS: Sputter deposition and do**

S Sandeep, RMR Pinto, J Rudresh… - Critical Reviews in …, 2024 - Taylor & Francis
Amongst the piezoelectric thin films suited for microelectromechanical systems (MEMS), AlN
has gained particular technological relevance due to its unique material properties (large …

[HTML][HTML] Glancing angle deposition and growth mechanism of inclined AlN nanostructures using reactive magnetron sputtering

S Bairagi, K Järrendahl, F Eriksson, L Hultman, J Birch… - Coatings, 2020 - mdpi.com
Glancing angle deposition (GLAD) of AlN nanostructures was performed at room
temperature by reactive magnetron sputtering in a mixed gas atmosphere of Ar and N2. The …

[HTML][HTML] A film-texture driven piezoelectricity of AlN thin films grown at low temperatures by plasma-enhanced atomic layer deposition

T Nguyen, N Adjeroud, S Glinsek, Y Fleming, J Guillot… - Apl Materials, 2020 - pubs.aip.org
Simultaneously inducing preferred crystalline orientation with a strong piezoelectric
response in polycrystalline aluminum nitride (AlN) thin films by atomic layer deposition is a …

The evolution of preferred orientation and morphology of AlN films under various sputtering parameters

Z Wei, L Shen, Y Kuang, J Wang, G Yang, W Lei - Journal of Crystal Growth, 2024 - Elsevier
Wurtzite aluminum nitride (AlN) films with (1 0 0) and (0 0 2) preferred orientations are
obtained on Si (1 0 0) wafers by radio frequency magnetron sputtering. The effects of target …

Study on optimizing c-axis oriented AlN thin film for piezoelectric sensing applications controlling the sputtering process parameters

M Vanamoorthy, B Salim, K Mohanta - Applied Physics A, 2022 - Springer
The crystal orientation of aluminium nitride (AlN) thin film poses a challenge in piezoelectric
applications, where the orientation of (002) is desired for obtaining a high piezoelectric …

Preparation and properties of AlN (aluminum nitride) powder/thin films by single source precursor

H Chaurasia, SK Tripathi, K Bilgaiyan… - New Journal of …, 2019 - pubs.rsc.org
The aluminum nitride (AlN) powder/thin films were prepared from an aluminum–urea
complex. The complex, hexa urea aluminate (III) chloride, has proven to be a potential single …

Improved Crystallinity of Annealed 0002 AlN Films on Sapphire Substrate

BC Bersch, T Caminal Ros, V Tollefsen… - Materials, 2023 - mdpi.com
AlN is a piezoelectric material used in telecommunication applications due to its high
surface acoustic wave (SAW) velocity, stability, and mechanical strength. Its performance is …

Residual stress reduction in piezoelectric Sc0. 4Al0. 6N films by variable-pressure sputtering from 0.4 to 1.0 Pa

T Tabaru, M Akiyama - Thin Solid Films, 2019 - Elsevier
Scandium aluminum nitride (ScAlN) films are promising piezoelectric materials for various
microelectromechanical systems. However, residual stress in ScAlN films is a serious …