Gate leakage mechanisms in normally off p-GaN/AlGaN/GaN high electron mobility transistors

N Xu, R Hao, F Chen, X Zhang, H Zhang… - Applied Physics …, 2018 - pubs.aip.org
In this letter, gate leakage mechanisms in different gate contact normally off p-
GaN/AlGaN/GaN high electron mobility transistors (HEMTs) have been studied by the …

[HTML][HTML] Design and analysis of 10 nm T-gate enhancement-mode MOS-HEMT for high power microwave applications

T Zine-eddine, H Zahra, M Zitouni - Journal of Science: Advanced Materials …, 2019 - Elsevier
In this work, we propose a novel enhancement-mode GaN metal-oxide-semiconductor high
electron mobility transistor (MOS-HEMT) with a 10 nm T-gate length and a high-k TiO 2 gate …

Analysis of low voltage RF power capability on AlGaN/GaN and InAlN/GaN HEMTs for terminal applications

Y Zhou, J Zhu, M Mi, M Zhang, P Wang… - IEEE Journal of the …, 2021 - ieeexplore.ieee.org
In this work, low voltage RF power capability on AlGaN/GaN and InAlN/GaN HEMTs is
analyzed from the perspective of DC and pulse characteristics, for terminal applications …

Ti/Au/Al/Ni/Au low contact resistance and sharp edge acuity for highly scalable AlGaN/GaN HEMTs

YK Yadav, BB Upadhyay, M Meer… - IEEE Electron …, 2018 - ieeexplore.ieee.org
In this letter, we have reported a novel metal scheme Ti/Au/Al/Ni/Au for ohmic contact on
AlGaN/GaN high-electron-mobility transistors. The reported metal scheme is observed to …

Gate leakage suppression and breakdown voltage enhancement in p-GaN HEMTs using metal/graphene gates

G Zhou, Z Wan, G Yang, Y Jiang… - … on Electron Devices, 2020 - ieeexplore.ieee.org
In this article, single-layer intrinsic and fluorinated graphene were investigated as gate
insertion layers in normally-OFF p-gallium nitride (GaN) gate high electron mobility …

High efficiency over 70% at 3.6-GHz InAlN/GaN HEMT fabricated by gate recess and oxidation process for low-voltage RF applications

Y Zhou, M Mi, Y Han, P Wang, Y Chen… - … on Electron Devices, 2022 - ieeexplore.ieee.org
In this work, high-efficiency InAlN/GaN high electron mobility transistor (HEMT) is fabricated
by recess and oxidation process under the gate (RAO) for low-voltage RF applications …

A High RF-Performance AlGaN/GaN HEMT With Ultrathin Barrier and Stressor In Situ SiN

S Wu, M Mi, M Zhang, L Yang, B Hou… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
The submicrometer gate HEMT is fabricated with an ultrathin-barrier (UTB) AlGaN/gallium
nitride (GaN) combined with in situ SiN passivation. The sheet resistance of the UTB Al 0.2 …

High-efficiency millimeter-wave enhancement-mode ultrathin-barrier AlGaN/GaN fin-HEMT for low-voltage terminal applications

Y Zhou, M Mi, C Gong, P Wang, X Wen… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In this work, high-efficiency millimeter-wave enhancement-mode (E-mode) Fin-high electron
mobility transistor (HEMT) is fabricated to satisfy low-voltage terminal applications, whose …

A novel AlGaN/GaN heterostructure field-effect transistor based on open-gate technology

Y Liu, Y Lv, S Guo, Z Luan, A Cheng, Z Lin, Y Yang… - Scientific reports, 2021 - nature.com
In this study, a novel AlGaN/GaN heterostructure field-effect transistor based on open-gate
technology was fabricated. Sample transistors of different structures and sizes were …

Reducing the reverse leakage current of AlGaN/GaN heterostructures via low-fluence neutron irradiation

R Wang, J Xu, S Zhang, Y Zhang, P Zheng… - Journal of Materials …, 2021 - pubs.rsc.org
Reduction of the reverse leakage current is critical to AlGaN/GaN heterostructures in high
power and high frequency applications. Taking AlGaN/GaN Schottky barrier diodes (SBDs) …