Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

This book is a practical guide to electron diffraction in the transmission electron microscope
(TEM). Case studies and examples are used to provide an invaluable introduction to the …

Microdiffraction patterns obtained with a focused and nearly parallel incoherent electron
beam allow one to obtain the crystal system and the Bravais lattice and to reveal the …

Glossary of Terms Page 1 Glossary of Terms A A. The symbol for a repeating unit in a polymer
chain. ABA copolymers. Block copolymers with three sequences, but only two domains. Abbe …

The application of convergent beam electron diffraction (CBED) to determine symmetry,
refine structure factors, and measure specimen thickness requires rather thick specimen and …

In the scanning electron microscope using electron backscattered diffraction, it is possible to
measure the spacing of the layers in the reciprocal lattice. These values are of great use in …

Glass formation for a series of 10 glasses on or near the Y2O3‐SiO2‐AIN plane of the Y‐Si‐
Al‐O‐N system was found to be strongly dependent on composition with the best …

The algorithm developed by Rozeveld and Howe [Ultramicroscopy 50 (1993) 41–56] to
determine multiple lattice parameters from convergent-beam electron diffraction patterns has …

A brief review is presented of the methods of measuring lattice parameters and strain using
diffraction techniques. The presence of strain leads to broadening of diffraction maxima …

The power of transmission electron microscopy for the characterization of crystalline
materials has been greatly increased by the technique of convergent-beam electron …