This work presents a single-and dual-port fully integrated millimeter-wave ultra-broadband
vector network analyzer. Both circuits, realized in a commercial 0.35-μm SiGe: C technology …

A novel nondestructive method for effective permittivity measurement and detection of
sample's permittivity change in microwave frequency range has been proposed, utilizing a …

This article presents a novel extraction method for parasitic parameters of on-wafer
calibration standards using an optimization strategy. Based on the physical models of the …

Differential circuits are commonly used for millimeter-wave monolithic integrated circuits
such as amplifiers and voltage-controlled oscillators. The infrastructure for their …

We present a balun-free, pure differential-mode noncontact measurement technique for on-
wafer characterization of devices and integrated circuits (ICs). We demonstrate the validity of …

Two balun methods for measuring the impedance and efficiency of a differentially driven
microstrip antenna with a two-port vector network analyzer are evaluated. It is shown that the …

There has been a growing interest in develo** differential Millimeter-wave Monolithic
Integrated Circuits (MMICs) in recent years. The characterization infrastructure for these …

In this paper, we show that the differential noise figure of differential amplifiers is better
measured directly by using baluns rather than be derived from single-ended measurements …

This chapter focuses on coupled-line section sensors operating under differential excitation
utilized for wideband characterization of dielectric materials. Various realizations of sensors …

This paper demonstrates the first differential on-wafer probe with integrated balun operating
in the WR-3.4 (220-330 GHz) waveguide band. The probe employs integrated balun circuitry …