Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging
S Tougaard - Journal of Electron Spectroscopy and Related …, 2010 - Elsevier
Models for energy loss in XPS are reviewed. We start with rigorous models to describe the
fundamental interaction of the electric fields from both the core-hole and the moving electron …
fundamental interaction of the electric fields from both the core-hole and the moving electron …
[LIBRO][B] Handbook of surface and interface analysis: methods for problem-solving
JC Riviere, S Myhra - 2009 - taylorfrancis.com
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was
based on the authors' firm belief that characterization and analysis of surfaces should be …
based on the authors' firm belief that characterization and analysis of surfaces should be …
Proximity coupling induced two dimensional magnetic order in EuO-based synthetic ferrimagnets
P Rosenberger, M Kundu, A Gloskovskii… - Scientific Reports, 2024 - nature.com
Proximity effects allow for the adjustment of magnetic properties in a physically elegant way.
If two thin ferromagnetic (FM) films are brought into contact, electronic coupling alters their …
If two thin ferromagnetic (FM) films are brought into contact, electronic coupling alters their …
Surface and in-depth distribution of sp2 and sp3 coordinated carbon atoms in diamond-like carbon films modified by argon ion beam bombardment during growth
J Zemek, J Houdkova, P Jiricek, M Jelinek - Carbon, 2018 - Elsevier
Carbon atom coordination at diamond-like carbon (DLC) film surfaces and in sub-surface
regions has been determined nondestructively from high-energy resolved C 1s …
regions has been determined nondestructively from high-energy resolved C 1s …
Operando observation of nickel/ceria electrode surfaces during intermediate temperature steam electrolysis
V Papaefthimiou, DK Niakolas, F Paloukis… - Journal of catalysis, 2017 - Elsevier
The solid oxide electrolysis cell (SOEC) technology has a huge potential for future mass
production of hydrogen, mainly due to its high electrical-to-chemical energy conversion …
production of hydrogen, mainly due to its high electrical-to-chemical energy conversion …
Zn–Se–Cd–S Interlayer Formation at the CdS/Cu2ZnSnSe4 Thin-Film Solar Cell Interface
The chemical structure of the CdS/Cu2ZnSnSe4 (CZTSe) interface was studied by a
combination of electron and X-ray spectroscopies with varying surface sensitivity. We find …
combination of electron and X-ray spectroscopies with varying surface sensitivity. We find …
[HTML][HTML] Quantitative interpretation of molecular dynamics simulations for X-ray photoelectron spectroscopy of aqueous solutions
Over the past decade, energy-dependent ambient pressure X-ray photoelectron
spectroscopy (XPS) has emerged as a powerful analytical probe of the ion spatial …
spectroscopy (XPS) has emerged as a powerful analytical probe of the ion spatial …
Interpretation of nanoparticle X-ray photoelectron intensities
WSM Werner, M Chudzicki, W Smekal… - Applied Physics …, 2014 - pubs.aip.org
X-ray photoelectron (XPS) intensities have been simulated for spherical core-shell
nanoparticles (NPs) in different geometrical arrangements in order to investigate the validity …
nanoparticles (NPs) in different geometrical arrangements in order to investigate the validity …
Sacrificial self-assembled monolayers for the passivation of GaAs (100) surfaces and interfaces
D Cuypers, C Fleischmann, DH van Dorp… - Chemistry of …, 2016 - ACS Publications
The use of sacrificial self-assembled monolayers (SAMs) to prepare clean n-type GaAs
(100) surfaces without band bending in vacuo is demonstrated. GaAs surface passivation …
(100) surfaces without band bending in vacuo is demonstrated. GaAs surface passivation …
Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy
A Jablonski, CJ Powell - Journal of electron spectroscopy and related …, 2017 - Elsevier
The effective attenuation length (EAL) is normally used in place of the inelastic mean free
path (IMFP) to account for elastic-scattering effects when describing the attenuation of Auger …
path (IMFP) to account for elastic-scattering effects when describing the attenuation of Auger …