Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the
surface potential on a broad range of materials. KPFM measurements require an …

This review highlights the potential of Kelvin probe force microscopy (KPFM) beyond
imaging to simultaneously study structural and electronic properties of functional surfaces …

The possibility of obtaining a detailed picture of the electronic structure makes surface
photovoltage spectroscopy (SPS) eminently suitable for bridging the gap between the …

Kelvin probe force microscopy is a scanning probe technique capable of map** the local
surface potential or work function on various surfaces with high spatial resolution. This …

Fundamental mechanisms of energy storage, corrosion, sensing, and multiple biological
functionalities are directly coupled to electrical processes and ionic dynamics at solid–liquid …

In microelectronics and biology, many fundamental processes involve the exchange of
charges between small objects, such as nanocrystals in photovoltaic blends or individual …

The determination of local electrical, electrostatic, and transport properties of materials by
ambient scanning probe microscopy (SPM) is shown to be strongly affected by the …

Two-dimensional layered materials have attracted attention for optoelectronic applications
owing to their remarkable photonic properties. Here, we report a homojunction device …

Rhenium disulfide (ReS2) has attracted immense interest as a promising two-dimensional
material for optoelectronic devices owing to its outstanding photonic response based on its …

We study the influence of different experimental parameters on the interaction between the
probe and the sample in Kelvin probe force microscopy (KPFM) measurements. We provide …