PUFs have emerged as an alternative to traditional Non-Volatile Memories in the field of
hardware security. In this paper, a novel PUF is proposed that uses the Random Telegraph …

The origin of some time-dependent variability phenomena in FET technologies has been
attributed to the charge carrier trap**/detrap** activity of individual defects present in …

A Physical Unclonable Function (PUF) that uses the Random Telegraph Noise (RTN) effect
has been recently proposed. This PUF requires an analog sensing component whose …

Silicon Physical Unclonable Functions (PUFs) have emerged as a promising solution for
generating cryptographic keys in low-cost resource-constrained devices. A PUF is expected …

Random telegraph noise (RTN) adversely impacts circuit performance and this impact
increases for smaller devices and lower operation voltage. To optimize the circuit design …

Physical Unclonable Functions (PUFs) have emerged as more secure alternatives to
traditional Non-Volatile Memories in the field of hardware security. Recently, a novel PUF …

Time-Dependent Variability (TDV) phenomena represent a serious concern for device and
circuit reliability. To address the TDV impact at circuit level, Reliability-Aware Design (RAD) …

Physical Unclonable Functions (PUFs) use variability as an entropy source from which to
generate secure authentication and identification. While most silicon PUFs exploit the well …

Random telegraph noise (RTN) is a time-dependent variability phenomenon that has gained
increased attention during the last years, especially in deeply scaled technologies. In …

Random Telegraph Noise (RTN) is an intriguing entropy source that can be exploited to
develop lightweight cryptographic primitives. Its utility in Physical Unclonable Functions …