Radiation-induced point-and cluster-related defects with strong impact on damage properties of silicon detectors

I Pintilie, G Lindstroem, A Junkes, E Fretwurst - Nuclear Instruments and …, 2009 - Elsevier
This work focuses on the investigation of radiation-induced defects responsible for the
degradation of silicon detector performance. Comparative studies of the defects induced by …

[BOOK][B] Charged semiconductor defects: structure, thermodynamics and diffusion

EG Seebauer, MC Kratzer - 2008 - books.google.com
Defects in semiconductors have been studied for many years, in many cases with a view
toward controlling their behaviour through various forms of “defect engineering”. For …

Influence of radiation induced defect clusters on silicon particle detectors

A Junkes - 2011 - osti.gov
The Large Hadron Collider (LHC) at the European Organization for Nuclear Research
(CERN) addresses some of today's most fundamental questions of particle physics, like the …

[BOOK][B] Silicon, germanium, and their alloys: growth, defects, impurities, and nanocrystals

G Kissinger, S Pizzini - 2014 - books.google.com
Despite the vast knowledge accumulated on silicon, germanium, and their alloys, these
materials still demand research, eminently in view of the improvement of knowledge on …

Kinetics of divacancy annealing and divacancy-oxygen formation in oxygen-enriched high-purity silicon

M Mikelsen, EV Monakhov, G Alfieri, BS Avset… - Physical Review B …, 2005 - APS
In this work the thermal kinetics of the transformation from the divacancy (V 2) to the
divacancy-oxygen (V 2 O) complex has been studied in detail, and activation energies,(E a) …

Stable radiation-induced donor generation and its influence on the radiation tolerance of silicon diodes

I Pintilie, M Buda, E Fretwurst, G Lindström… - Nuclear Instruments and …, 2006 - Elsevier
Four different kinds of silicon materials (standard float zone—FZ, oxygen enriched FZ—
DOFZ, Czochralski—Cz and thin epitaxial layers grown on Cz substrates—Epi/Cz) have …

Annealing of the divacancy-oxygen and vacancy-oxygen complexes in silicon

M Mikelsen, JH Bleka, JS Christensen… - Physical Review B …, 2007 - APS
After low dose electron irradiation, annealing kinetics of divacancy-oxygen (V 2 O) and
vacancy-oxygen (VO) complexes in carbon-lean n-type magnetic Czochralski (MCZ) and …

Kinetics of Carrier Lifetime Degradation in High‐Temperature 1 MeV Electron‐Irradiated Cz n‐Si Associated with the Formation of Divacancy‐Oxygen Defects

M Kras' ko, A Kolosiuk, V Povarchuk… - physica status solidi …, 2024 - Wiley Online Library
Kinetics of degradation of the nonequilibrium charge carrier lifetime (τ) in Czochralski‐grown
(Cz) n‐Si irradiated with 1 MeV electrons at different temperatures in the range from 20 to …

Combined techniques for recovery of radiation damaged detectors

T Ceponis, M Burkanas, A Cicinas, L Deveikis… - Materials Science in …, 2023 - Elsevier
Radiation defects introduced by the electrons and X-rays emitted by the linear Varian
TrueBeam type commercial therapy accelerators have been examined by combining various …

A bistable divacancylike defect in silicon damage cascades

RM Fleming, CH Seager, DV Lang, E Bielejec… - Journal of Applied …, 2008 - pubs.aip.org
Two deep level transient spectroscopy (DLTS) electron emission signatures, previously
labeled E4 and E5, have been shown to be bistable with respect to minority carrier injection …