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OML: an online multi-particle locating method for high-resolution single-event effects studies
YH Jia, JW Liao, HB Yang, QH Duan, LJ Wang… - Nuclear Science and …, 2024 - Springer
Identifying sensitive areas in integrated circuits susceptible to single-event effects (SEE) is
crucial for improving radiation hardness. This study presents an online multi-track location …
crucial for improving radiation hardness. This study presents an online multi-track location …
Prototype of Hi'Beam-SEE: A Real-time High-resolution Single Event Effects Locating Device for Heavy Ion Facilities
J Liao, Y Jia, S Liao, J Du, H Yang… - … on Nuclear Science, 2025 - ieeexplore.ieee.org
Integrated circuits (ICs) are widely used in spacecraft and are concerned with the probability
of Single Event Effects (SEEs). To accurately locate the SEE-sensitive area of ICs, we have …
of Single Event Effects (SEEs). To accurately locate the SEE-sensitive area of ICs, we have …