Mechanical and electromechanical properties of 2D materials studied via in situ microscopy techniques

BJ Wang, WL Wu, XL Wei, Q Chen - Nanoscale, 2025‏ - pubs.rsc.org
Two-dimensional (2D) materials with van der Waals stacking have been reported to have
extraordinary mechanical and electromechanical properties, which enable them …

Enhancing scanning electron microscopy imaging quality of weakly conductive samples through unsupervised learning

X Gao, T Huang, P Tang, J Di, L Zhong, W Zhang - Scientific Reports, 2024‏ - nature.com
Scanning electron microscopy (SEM) is a crucial tool for analyzing submicron-scale
structures. However, the attainment of high-quality SEM images is contingent upon the high …

Simultaneous secondary electron microscopy in the scanning transmission electron microscope with applications for in situ studies

ML San Gabriel, C Qiu, D Yu, T Yaguchi, JY Howe - Microscopy, 2024‏ - academic.oup.com
Scanning/transmission electron microscopy (STEM) is a powerful characterization tool for a
wide range of materials. Over the years, STEMs have been extensively used for in situ …

Liquid-Phase Scanning Electron Microscopy for Imaging Hydrated Particle Structures

ML San Gabriel, D Yu, M Brillantes, S Dogel… - 2024‏ - academic.oup.com
Liquid-phase electron microscopy (LP-EM) is a novel characterization technique for in situ
observation of samples in liquid environments. Electron microscopes traditionally operate …