[BOOK][B] Interferogram analysis for optical testing

Z Malacara, M Servin - 2018 - taylorfrancis.com
In this day of digitalization, you can work within the technology of optics without having to
fully understand the science behind it. However, for those who wish to master the science …

Efficient nonlinear algorithm for envelope detection in white light interferometry

KG Larkin - JOSA A, 1996 - opg.optica.org
A compact and efficient algorithm for digital envelope detection in white light interferograms
is derived from a well-known phase-shifting algorithm. The performance of the new …

Automated fringe pattern analysis in experimental mechanics: a review

JM Huntley - The Journal of Strain Analysis for Engineering …, 1998 - journals.sagepub.com
The paper reviews the main numerical techniques that have been developed to carry out
fully automated analysis of fringe patterns resulting from solid mechanics experiments …

[BOOK][B] Handbook of optical metrology: Principles and Applications

T Yoshizawa - 2009 - taylorfrancis.com
The field of optical metrology offers a wealth of both practical and theoretical
accomplishments, and can cite any number of academic papers recording such. However …

Complex-wave retrieval from a single off-axis hologram

M Liebling, T Blu, M Unser - JOSA A, 2004 - opg.optica.org
We present a new digital two-step reconstruction method for off-axis holograms recorded on
a CCD camera. First, we retrieve the complex object wave in the acquisition plane from the …

[BOOK][B] Optical inspection of Microsystems

W Osten, A Duparre, C Furlong, I De Wolf, A Asundi… - 2018 - taylorfrancis.com
Where conventional testing and inspection techniques fail at the micro-scale, optical
techniques provide a fast, robust, and relatively inexpensive alternative for investigating the …

Generating model signals for interferometry

XC De Lega - US Patent 7,619,746, 2009 - Google Patents
4. 5 23s46 A 6/1985 Breckinridge et al. test Surface in a second mode of operation that
interferometri 4.576. 479 A 3, 1986 Downs cally profiles a topography of the test Surface …

Ultrafast imaging interferometry at femtosecond-laser-excited surfaces

VV Temnov, K Sokolowski-Tinten, P Zhou… - JOSA B, 2006 - opg.optica.org
A simple and robust setup for femtosecond time-resolved imaging interferometry of surfaces
is described. The apparatus is capable of measuring both very small phase shifts (∼ 3× …

3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope

S Petitgrand, R Yahiaoui, K Danaie… - Optics and lasers in …, 2001 - Elsevier
Microscopic interferometry is a powerful technique for the static and dynamic
characterization of micromechanical devices. In this paper we emphasize its capabilities for …

Heterodyne detection of the complete electric field of femtosecond four-wave mixing signals

SM Gallagher, AW Albrecht, JD Hybl, BL Landin… - JOSA B, 1998 - opg.optica.org
A novel optimized heterodyne method that recovers the complete electric field of any four-
wave mixing signal at its point of origin is demonstrated. A tracer pulse is sent along the …