Imaging mass spectrometry (MS) has created new fundamental research opportunities in
many fields because of its unique ability to acquire molecule-and element-specific pictures …

Although germanium (Ge)(001) has a relatively small surface unit cell, this surface displays
a wealth of fascinating phenomena. The Ge (001) surface is a prototypical example of a …

Beginning with some introductory remarks about aims and scope, historical background and
present state of the art, a brief survey of the technique of sputter depth profiling is given. The …

The paper reviews the nature of radiation damage produced in inorganic target materials by
sputtering with low-energy ion and atom beams, both in general and for particular types of …

An overview is given of the possibilities and limitations of secondary ion mass spectrometry
as an analytical tool in the investigation of near-perfect, ie almost atomically sharp, dopant …

The motion of naturally occurring vacancies on Si (001)-(2× 1) has been investigated in real
time with scanning tunneling microscopy, using a novel method in which repeated line …

Scanning tunneling microscopy (STM) studies of spontaneous halogen etching of Si (100)-
2× 1 and Si (111) in the range 700–1100 K are reviewed. Although the morphology depends …

The modifications of solids induced by irradiation with energetic ions have been the subject
of numerous studies with a large variety of methods, including in particular also microscopy …

Using scanning tunneling microscopy (STM) and time of flight secondary ion mass
spectrometry (TOF/SIMS), we observed radiation effects on a Si (111)-(7× 7) surface in the …

In secondary ion mass spectrometry, henceforth abbreviated to SIMS, use is made of a
phenomenon called sputtering. When energetic (> 0.1 keV atom') ions, atoms or molecules …