Modeling for single-photon avalanche diodes: State-of-the-art and research challenges

X Qian, W Jiang, A Elsharabasy, MJ Deen - Sensors, 2023 - mdpi.com
With the growing importance of single-photon-counting (SPC) techniques, researchers are
now designing high-performance systems based on single-photon avalanche diodes …

Fourier analysis in single photon imaging

M Laurenzis, E Bacher - Optics Express, 2024 - opg.optica.org
Single photon imaging has become an established sensing approach. Compared to
intensity imaging, versatile advantages have been demonstrated, such as imaging with high …

A Fokker–Planck-based Monte Carlo method for electronic transport and avalanche simulation in single-photon avalanche diodes

R Helleboid, D Rideau, I Nicholson… - Journal of Physics D …, 2022 - iopscience.iop.org
We present an efficient simulation method for electronic transport and avalanche in single-
photon avalanche diodes (SPAD). Carrier transport is simulated in the real space using a …

Comprehensive modeling and characterization of photon detection efficiency and jitter tail in advanced SPAD devices

R Helleboid, D Rideau, J Grebot… - IEEE Journal of the …, 2022 - ieeexplore.ieee.org
A new method to reliably simulate the PDE and jitter tail for realistic three-dimensional SPAD
devices is presented. The simulation method is based on the use of electric field lines to …

Statistical measurements and Monte-Carlo simulations of DCR in SPADs

M Sicre, M Agnew, C Buj, C Coutier… - … 2022-IEEE 48th …, 2022 - ieeexplore.ieee.org
Dark Count Rate (DCR) in 3D-stacked CMOS Single-Photon Avalanche Diode (SPAD) is
investigated by means of measurements and simulations at various temperatures and …

[HTML][HTML] Integrated detection optics for scalable ion-traps for quantum technologies

A Chatterjee, L Vieler, M Kromrey, A Kravchenko… - Measurement …, 2025 - Elsevier
The''Scalable integrated ion-traps for Quantum Technologies''(SiQT) project within the
Quantum Valley Lower Saxony (QVLS)-Integration laboratories (iLabs) focuses on the …

Characterization and modeling of DCR and DCR drift variability in SPADs

M Sicre, X Federspiel, B Mamdy, D Roy… - 2023 IEEE …, 2023 - ieeexplore.ieee.org
A quadratic relationship between the Dark Count Rate drift (Δ DCR) device-to-device
variance ΔDCR^2 and its mean ΔDCR regardless of stress conditions, architectures, and …

Spectral Responsivity and Photoresponse Non-Uniformity of a Perimeter-Gated Single-Photon Avalanche Diode Imager

F Dehghandehnavi, MS Sajal, KC Lin… - 2023 IEEE 66th …, 2023 - ieeexplore.ieee.org
In this paper we investigated the spectral responsivity and photoresponse non-uniformity
(PRNU) of a perimeter-gated single-photon avalanche diode (pg-SPAD) imager fabricated …