A review of board level solder joints for mobile applications

EH Wong, SKW Seah, VPW Shim - Microelectronics Reliability, 2008 - Elsevier
The reliability of electronics under drop-shock conditions has attracted significant interest in
recent years due to the widespread use of mobile electronic products. This review focuses …

Assembly options and challenges for electronic products with lead-free exemption

CM Huang, A Raj, M Osterman, M Pecht - IEEE Access, 2020 - ieeexplore.ieee.org
Due to safety and reliability concerns, various classes and/or applications of electronic
products are excluded from the European Union's Restriction of Hazardous Substances …

The effect of Bi on the mechanical properties of aged SAC solder joint

MEA Belhadi, FJ Akkara, R Athamenh… - 2020 19th IEEE …, 2020 - ieeexplore.ieee.org
Recent studies demonstrate significant reductions in mechanical properties of lead-free
interconnection materials in harsh environments such as automotive and military …

Advances in the drop-impact reliability of solder joints for mobile applications

EH Wong, SKW Seah, WD Van Driel, J Caers… - Microelectronics …, 2009 - Elsevier
This manuscript presents the research studies in the drop-impact reliability of solder joints in
the PCB assemblies intended for mobile applications. The works cover stress–strain …

Effects of surface finish on the shear fatigue of SAC-based solder alloys

S Su, M Jian - IEEE Transactions on Components, Packaging …, 2019 - ieeexplore.ieee.org
Solder joints in electronic assemblies are subjected to mechanical cycling in normal
operating conditions. Testing individual solder joint in mechanical cycling allows monitoring …

Effect of surface finish on the shear properties of SnAgCu-based solder alloys

S Su, K Hamasha - IEEE Transactions on Components …, 2019 - ieeexplore.ieee.org
The reliability of an electronic assembly is typically limited by the failure of one of the solder
interconnections. One of the key factors that define the quality of solder interconnections is …

Brittle failure mechanism of SnAgCu and SnPb solder balls during high speed ball shear and cold ball pull tests

F Song, SWR Lee, K Newman… - 2007 Proceedings …, 2007 - ieeexplore.ieee.org
This study investigated brittle solder joint failure mechanisms during high-speed solder ball
shear and pull testing. BGA package samples with different solder alloys (Sn4. 0% Ag0. 5 …

Fan-out wafer-level packaging (FOWLP) of large chip with multiple redistribution layers (RDLs)

J Lau, M Li, N Fan, E Kuah, Z Li… - Journal of …, 2017 - meridian.allenpress.com
This study is for fan-out wafer-level packaging with chip-first (die face-up) formation. Chips
with Cu contact-pads on the front side and a die attach film on the backside are picked and …

Impact of Ni concentration on the intermetallic compound formation and brittle fracture strength of Sn–Cu–Ni (SCN) lead-free solder joints

C Yang, F Song, SWR Lee - Microelectronics Reliability, 2014 - Elsevier
Abstract Cu 6 Sn 5 and Cu 3 Sn are common intermetallic compounds (IMCs) found in Sn–
Ag–Cu (SAC) lead-free solder joints with OSP pad finish. People typically attributed the …

Experimental analysis of Model-Based Roentgen Stereophotogrammetric Analysis (MBRSA) on four typical prosthesis components

F Seehaus, J Emmerich, BL Kaptein, H Windhagen… - 2009 - asmedigitalcollection.asme.org
Classical marker-based roentgen stereophotogrammetric analysis (RSA) is an accurate
method of measuring in vivo implant migration. A disadvantage of the method is the …