With fabrication technology reaching nanolevels, systems are becoming more prone to
manufacturing defects with higher susceptibility to soft errors. This paper is focused on …

Modern integrated circuits require careful attention to the soft errors resulting into bit upsets,
which are normally caused by alpha particle or neutron hits. These events, also referred to …

As technology nodes are gradually shrinking, adding soft error tolerant features to logic
circuits is becoming a challenging task that requires careful consideration. Careless use of …

The implementation of semiconductor circuits and systems in nano-technology makes it
possible to achieve high speed, lower voltage level and smaller area. The unintended and …

Many techniques to relieve soft error problem, such as making the circuit larger, called
upsizing, have been developed under tight limitation in circuit performance but they all call …

Dealing with soft errors due to particle strikes is the next major challenge in implementing
digital systems. This study thoroughly investigates the effect of device size on circuit soft …

Described herein is a method implemented by circuitry for providing fault tolerance in a
combinational circuit. The circuitry identifies sensitive gates of the circuit that require …

As technology nodes are being scaled down, soft errors induced by particle strikes are
becoming a troublesome reliability issue in logic circuits. Various sizing techniques …

With fabrication technology reaching nano-scale, systems are becoming more prone to
manufacturing defects with higher susceptibility to soft errors due to the exponential …

With the scaling of technology node and voltage levels, VLSI circuits are facing the
challenge of tolerance to soft errors normally caused by alpha particle or neutron hits. These …