[LIBRO][B] The practical handbook of genetic algorithms: applications

LD Chambers - 2000 - taylorfrancis.com
Rapid developments in the field of genetic algorithms along with the popularity of the first
edition precipitated this completely revised, thoroughly updated second edition of The …

[LIBRO][B] The automatic generation of software test data using genetic algorithms

HH Sthamer - 1995 - search.proquest.com
Abstract Genetic Algorithms (GAs) have been used successfully to automate the generation
of test data for software developed in ADA83. The test data were derived from the program's …

A strategy for using genetic algorithms to automate branch and fault-based testing

BF Jones, DE Eyres, HH Sthamer - the computer journal, 1998 - academic.oup.com
Genetic algorithms have been used successfully to generate software test data
automatically; all branches were covered with substantially fewer generated tests than …

A brief overview of test solution development for semiconductor testing

NS Rai, N Palecha, M Nagarai - 2019 4th International …, 2019 - ieeexplore.ieee.org
Semiconductor industries perform testing to ensure good performance of the device under
different operating conditions. The time consumed in testing the device by traditional testing …

Non blind watermarking technique using enhanced one time pad in DWT domain

BJ Saha, KK Kabi, C Pradhan - … International Conference on …, 2014 - ieeexplore.ieee.org
The unlimited growth in internet and multimedia leads to large usage of images resulting in
huge storage and distribution of multimedia contents. With increasing use of digital …

Searching protection relay response time extremes using genetic algorithm-software quality by optimization

JT Alander, T Mantere, G Moghadampour, J Matila - 1997 - IET
In this work, the authors studying the possibilities of automating the searching and
measuring of response time extremes of power system protection relay software using …

Failure evasion: Statistically solving the NP complete problem of testing difficult-to-detect faults

M Venkatasubramanian - 2016 - search.proquest.com
A circuit with n primary inputs (PIs) has N= 2 n possible input vectors. A test vector to
correctly detect a fault in that circuit must be among those 2n n-bit combinations. Clearly, this …

Structural cell-based VLSI circuit design using a genetic algorithm

T Arslan, DH Horrocks… - 1996 IEEE International …, 1996 - ieeexplore.ieee.org
A technique for the structural synthesis of VLSI circuits is presented. The technique uses a
Genetic Algorithm which utilises a library of devices for the synthesis procedure which …

Statistical power estimation for register transfer level

YA Durrani, T Riesgo, F Machado - Proceedings of the …, 2006 - ieeexplore.ieee.org
In this paper, we propose a macromodeling approach that allows to estimate the power
dissipation of intellectual property (IP) components to their statistical knowledge of the …

[PDF][PDF] Structural synthesis of cell-based VLSI circuits using a multi-objective genetic algorithm

T Arslan, DH Horrocks, E Ozdemir - Electronics letters, 1996 - Citeseer
This letter presents the development of a technique which utilises a" Multi-Objective" Genetic
Algorithm for the structural synthesis of combinational VLSI circuits by utilising one or more …