SRAM caches are the most vulnerable processor component to radiation-induced soft
errors. Error-Correcting Codes (ECCs) are the conventional scheme to protect caches …

In ultra-low-power applications, the design of power-efficient static random access memory
(SRAM) is a major concern as it plays a significant part in leakage due to its higher density …

Scratchpad memories (SPMs) are intensively utilized in modern embedded processors
where a demand on improving reliability without compromising performance-predictability …

The increasing computing capacity of multicore components like processors and graphics
processing units (GPUs) offer new opportunities for embedded and high-performance …

This paper proposes a new sub-threshold low power 9T static random-access memory
(SRAM) cell compatible with bit interleaving structure in which the effective sizing adjustment …

FinFET technology appears as an alternative solution to mitigate short-channel effects in
traditional CMOS down-scaled technology. Emerging embedded systems are likely to …

This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs)
to perform fast and early soft error assessment of multicore systems. The authors show that …

Embedded systems reliability is a wide subject and complex subject. For this reason,
chapter two explores the main reliability challenges in electronic-based systems: Process …

Based on the analysis of the existing hard IP core testing technology, the hard IP core
nondestructive testing technology was studied, according to the verification requirements of …

The combination of constantly shrinking technology and ever-increasing on-chip power
density and temperature operation calls for novel reliability-oriented techniques which can …