AI/ML algorithms and applications in VLSI design and technology
An evident challenge ahead for the integrated circuit (IC) industry is the investigation and
development of methods to reduce the design complexity ensuing from growing process …
development of methods to reduce the design complexity ensuing from growing process …
Advancements and challenges on parasitic extraction for advanced process technologies
W Yu, M Song, M Yang - Proceedings of the 26th Asia and South Pacific …, 2021 - dl.acm.org
As the feature size scales down, the process technology becomes more complicated and the
design margin shrinks, accurate parasitic extraction during IC design is largely demanded …
design margin shrinks, accurate parasitic extraction during IC design is largely demanded …
Fast electrostatic analysis for VLSI aging based on generative learning
Electrostatic analysis, which computes electrical potential and electrical field, is important for
VLSI reliability and high speed circuit design. Deep learning provides new opportunities and …
VLSI reliability and high speed circuit design. Deep learning provides new opportunities and …
[BOOK][B] Modeling and Simulation Methods for VLSI Interconnect Reliability Focusing on Time Dependent Dielectric Breakdown
S Peng - 2021 - search.proquest.com
Time dependent dielectric breakdown (TDDB) is one of the important failure mechanisms for
Copper (Cu) interconnects that are used in VLSI circuits. This reliability effect becomes more …
Copper (Cu) interconnects that are used in VLSI circuits. This reliability effect becomes more …