In this paper, we address the problem of estimating and removing non-uniform motion blur
from a single blurry image. We propose a deep learning approach to predicting the …

Today, micro-electronic circuits are undeniably and ubiquitously present in our society.
Transportation vehicles such as cars, trains, buses, and airplanes make abundant use of …

This paper presents a physics-based compact modeling approach that incorporates the
impact of total ionizing dose (TID) and stress-induced defects into simulations of metal-oxide …

A blueprint for an atomistic approach to introducing time-dependent variability into a circuit
simulator in a realistic manner is demonstrated. The approach is based on previously …

With shrinking feature sizes, transistor aging due to NBTI and HCI becomes a major
reliability challenge for microprocessors. These processes lead to increased gate delays …

Abstract Bias Temperature Instability (BTI) is one of the most crucial reliability issues in
modern CMOS technology. It leads to shift in device parameters, which eventually affect …

Integrated circuit design in the late CMOS era is challenged by the ever-increasing
variability and reliability issues. The situation is further compounded by real-time …

In deeply scaled CMOS technology, time-dependent degradation mechanisms (TDDMs),
such as Bias Temperature Instability (BTI), have threatened the transistor performance …

True random number generators (TRNGs) are needed for a variety of security applications
and protocols. The quality (randomness) of TRNGs depends on sensitivity to random noise …

Device aging, which causes significant loss on circuit performance and lifetime, has been a
main factor in reliability degradation of nanoscale designs. Aggressive technology scaling …