US7876114B2 - Differential waveguide probe - Google Patents US7876114B2 - Differential
waveguide probe - Google Patents Differential waveguide probe Download PDF Info …

(56) References Cited US PATENT DOCUMENTS A probe head including an elastic
membrane capable of 1.337. 866 A 4, 1920 Whitacker exerting a restoring force when one of …

2,142,625 2,376,101 2,389,668 3,176,091 3,193,712 3,230,299 3,401,126 3.429, 040
3,441,315 3,442,831 3.445, 770 3,484,679 3,541.222 3,595,228 3,596,228 3,609,539 …

A probe station for probing a test device has a chuck element for supporting the test device.
An electrically conductive outer shield enclosure at least partially encloses such chuck …

(57) ABSTRACT A substrate, preferably constructed of a ductile material and a tool having
the desired shape of the resulting device for con tacting contact pads on a test device is …

US7656172B2 - System for testing semiconductors - Google Patents US7656172B2 -
System for testing semiconductors - Google Patents System for testing semiconductors …

US7403028B2 - Test structure and probe for differential signals - Google Patents US7403028B2
- Test structure and probe for differential signals - Google Patents Test structure and probe for …

Wafers or other structures comprising a plurality of dies or devices are tested at non-ambient
temperatures by inducing a first heat flux through a substantial portion of a surface of the …

3,561,280 3,573,617 3,596,228 3,609,539 3,611,199 3,619,780 3,622,915 3,634,807
3,648,169 3,654,585 3,662,318 3,680,037 3,686,624 3,700,998 3,705,379 3,710,251 …

(57) ABSTRACT A membrane probing assembly includes a probe card with conductors
supported thereon, wherein the conductors include at least a signal conductor located …