Residual stresses in deposited thin-film material layers for micro-and nano-systems manufacturing

M Huff - Micromachines, 2022 - mdpi.com
This review paper covers a topic of significant importance in micro-and nano-systems
development and manufacturing, specifically the residual stresses in deposited thin-film …

Integrated silicon photonic MEMS

N Quack, AY Takabayashi, H Sattari… - Microsystems & …, 2023 - nature.com
Silicon photonics has emerged as a mature technology that is expected to play a key role in
critical emerging applications, including very high data rate optical communications …

A critical review of microscale mechanical testing methods used in the design of microelectromechanical systems

VT Srikar, SM Spearing - Experimental mechanics, 2003 - Springer
Microelectromechanical systems (MEMS) technologies are evolving at a rapid rate with
increasing activity in the design, fabrication, and commercialization of a wide variety of …

The mechanical properties of atomic layer deposited alumina for use in micro-and nano-electromechanical systems

MK Tripp, C Stampfer, DC Miller, T Helbling… - Sensors and Actuators A …, 2006 - Elsevier
Mechanical characterization of atomic layer deposited (ALD) alumina (Al2O3) for use in
micro-and nano-electromechanical systems has been performed using several …

CAD challenges for microsensors, microactuators, and microsystems

SD Senturia - Proceedings of the IEEE, 1998 - ieeexplore.ieee.org
In parallel with the development of new technologies, new device configurations, and new
applications for microsensors, microactuators, and microsystems, also referred to as …

Polysilicon: a versatile material for microsystems

PJ French - Sensors and actuators A: Physical, 2002 - Elsevier
The initial attraction of polysilicon was the ability to deposit semiconductor layers on a wide
range of substrates. This leads to the development of polysilicon gate MOS, polysilicon …

[PDF][PDF] Electrostatic pull-in test structure design for in-situ mechanical property measurements of microelectromechanical systems (MEMS)

RK Gupta - 1997 - dspace.mit.edu
M-TEST, an electrostatic pull-in approach for the in-situ mechanical property measurements
of microelectromechanical systems (MEMS), is used to extract the Young's modulus and …

Optimization of a low-stress silicon nitride process for surface-micromachining applications

PJ French, PM Sarro, R Mallée, EJM Fakkeldij… - Sensors and Actuators A …, 1997 - Elsevier
A detailed examination of the effects of deposition parameters, using LPCVD, and
subsequent processing on the characteristics of silicon nitride is presented. The properties …

Surface micromachined tuneable interferometer array

K Aratani, PJ French, PM Sarro, D Poenar… - Sensors and Actuators A …, 1994 - Elsevier
The development of compact light modulators integrated on the same chip as the signal
processing opens many opportunities for combining inter-chip optical communications with …

Overview of residual stress in MEMS structures: Its origin, measurement, and control

S Dutta, A Pandey - Journal of Materials Science: Materials in Electronics, 2021 - Springer
Micro-electro-mechanical system (MEMS) technology has radically changed the scale,
performance, and cost of a wide variety of sensors and actuators by taking advantage of …