Improving combinational circuit reliability against multiple event transients via a partition and restructuring approach

MR Rohanipoor, B Ghavami… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
Traditionally, increasing logical masking probability has been used to improve the circuit
reliability against single-event transients (SETs). As the very first work, this paper presents a …

Reliability Evaluation of Digital Circuits Using Probabilistic Signal Flow Graphs

V Hamiyati Vaghef, A Peiravi - TABRIZ JOURNAL OF ELECTRICAL …, 2020 - tjee.tabrizu.ac.ir
Although reducing the size of transistors increased their capabilities considerably, but also
resulted in more susceptibility to transient errors. Thus, detecting the sensitive nodes of …

Hardware-Efficient Approximate Arithmetic Circuits for Deep Learning and Other Computation-Intensive Applications

MS Ansari - 2020 - era.library.ualberta.ca
Approximate computing (AC) is an emerging paradigm that leverages the inherent error
tolerance of many applications—such as image recognition, multimedia processing, and …

A Novel Low Power Consumption Soft Error-tolerant Latch

Z Zhang, Y ZHOU, J LIU, X CHENG, G XIE - 电子与信息学报, 2017 - jeit.ac.cn
A novel C-element connect method is proposed. The gate of P-type/N-type transistor is
modified from the top/bottom of conventional C-element to connect to output, which takes …

قابلیت اطمینان مدارهای دیجیتال با استفاده از گراف‌های سیگنال گذر احتمالاتی

حمیتی واقف, پیروی - مجله مهندسی برق دانشگاه تبریز, 2020‎ - tjee.tabrizu.ac.ir
کوچک‌شدن ابعاد ترانزیستورها سبب افزایش قابلیت‌های متعدد مدارهای دیجیتال شده ولی
آسیب‌پذیری آنها را در برابر خطاهای گذرا بیشتر کرده‌است. بنابراین تعیین نقاط حساس مدارهای …

[PDF][PDF] 一种新型低功耗抗软错误锁存器

张章, 周宇澄, 刘俊丞, 程心, 解光军 - 电子与信息学报, 2017 - edit.jeit.ac.cn
该文提出一种新型的C 单元的连接方法, 将距离输出节点比较远的P 型和N 型晶体管的栅端与C
单元的输出节点相连接, 利用晶体管自身的反馈机制形成反馈路径, 实现了自恢复功能 …