A key issue in the development of high-performance semiconductor devices is the ability to
properly measure active dopants at the nanometer scale. In ap–n junction, the abruptness of …

We demonstrate the use of both pixelated differential phase contrast (DPC) scanning
transmission electron microscopy (STEM) and off-axis electron holography (EH) for the …

Differential phase contrast (DPC) in scanning transmission electron microscopy can be used
to visualize electric field distributions within specimens in real space. However, for electric …

The low‐energy electrochemical production of hydrogen peroxide (H2O2) has garnered
significant attention as a viable alternative to traditional industrial routes, with the goal of …

It is well known that dynamical diffraction varies with changes in sample thickness and local
crystal orientation (due to sample bending). In differential phase contrast scanning …

Characterizing long‐range electric fields and built‐in potentials in functional materials at
nano to micrometer scales is of supreme importance for optimizing devices, eg, the …

Differential-phase-contrast scanning transmission electron microscopy (DPC STEM) is a
technique to directly visualize local electromagnetic field distribution inside materials and …

The electric field in a silicon p–n junction has been measured using pixelated scanning
transmission electron microscopy. By using a convergence angle of 3.2 mrad, a spatial …

Efficient imaging of biomolecules, two-dimensional materials, and electromagnetic fields
depends on retrieval of the phase of transmitted electrons. We demonstrate a method to …

We compare two transmission electron microscopy (TEM) based techniques that can
provide highly spatially resolved quantitative measurements of magnetic induction fields at …