[HTML][HTML] A review on the GaN-on-Si power electronic devices

Y Zhong, J Zhang, S Wu, L Jia, X Yang, Y Liu… - Fundamental …, 2022 - Elsevier
The past decades have witnessed a tremendous development of GaN-based power
electronic devices grown on Si substrate. This article provides a concise introduction …

Tutorial: Defects in semiconductors—Combining experiment and theory

A Alkauskas, MD McCluskey… - Journal of Applied …, 2016 - pubs.aip.org
Point defects affect or even completely determine physical and chemical properties of
semiconductors. Characterization of point defects based on experimental techniques alone …

GaN-based power devices: Physics, reliability, and perspectives

M Meneghini, C De Santi, I Abid, M Buffolo… - Journal of Applied …, 2021 - pubs.aip.org
Over the last decade, gallium nitride (GaN) has emerged as an excellent material for the
fabrication of power devices. Among the semiconductors for which power devices are …

The 2020 UV emitter roadmap

H Amano, R Collazo, C De Santi… - Journal of Physics D …, 2020 - iopscience.iop.org
Solid state UV emitters have many advantages over conventional UV sources. The (Al, In,
Ga) N material system is best suited to produce LEDs and laser diodes from 400 nm down to …

The 2018 GaN power electronics roadmap

H Amano, Y Baines, E Beam, M Borga… - Journal of Physics D …, 2018 - iopscience.iop.org
Gallium nitride (GaN) is a compound semiconductor that has tremendous potential to
facilitate economic growth in a semiconductor industry that is silicon-based and currently …

Measurement and analysis of photoluminescence in GaN

MA Reshchikov - Journal of applied physics, 2021 - pubs.aip.org
Photoluminescence (PL) spectroscopy is a powerful tool in studying semiconductor
properties and identifying point defects. Gallium nitride (GaN) is a remarkable …

Computationally predicted energies and properties of defects in GaN

JL Lyons, CG Van de Walle - NPJ Computational Materials, 2017 - nature.com
Recent developments in theoretical techniques have significantly improved the predictive
power of density-functional-based calculations. In this review, we discuss how such …

First-principles theory of nonradiative carrier capture via multiphonon emission

A Alkauskas, Q Yan, CG Van de Walle - Physical Review B, 2014 - APS
We develop a practical first-principles methodology to determine nonradiative carrier
capture coefficients at defects in semiconductors. We consider transitions that occur via …

“Leaky Dielectric” Model for the Suppression of Dynamic in Carbon-Doped AlGaN/GaN HEMTs

MJ Uren, S Karboyan, I Chatterjee… - … on Electron Devices, 2017 - ieeexplore.ieee.org
GaN-on-Si power switching transistors that use carbon-doped epitaxy are highly vulnerable
to dynamic R ON dispersion, leading to reduced switching efficiency. In this paper, we …

Defects and reliability of GaN‐based LEDs: review and perspectives

M Buffolo, A Caria, F Piva, N Roccato… - … status solidi (a), 2022 - Wiley Online Library
Herein, the main factors and mechanisms that limit the reliability of gallium nitride (GaN)‐
based light‐emitting diodes (LEDs) are reviewed. An overview of the defects …